Integrated Circuit Back Side Attack Detection via Substrate Resistance
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Solution Overview
Problem
Existing integrated circuit protection devices are ineffective against attacks performed from the back side, as they fail to detect and prevent alterations in the semiconductor substrate resistance, which can compromise the circuit's operation and confidentiality.
Innovation Solution
A semiconductor substrate with laterally defined wells and regions of different conductivity types, equipped with a detection system that applies potential differences and compares current flows to detect variations in resistance, triggering protective measures if an attack is detected.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If metal tracks of the last metallization levels are used for detection, then front side attacks can be detected, but back side attacks cannot be detected
Solution Approach 1:
The patent transitions from detecting attacks on the front surface (metallization levels) to detecting attacks on the back surface by measuring resistance variations in the semiconductor substrate. This dimensional shift enables detection of back side attacks while maintaining compatibility with existing front-side protection mechanisms.
2Reliability
If the integrated circuit structure is modified to detect back side attacks, then protection against back side attacks is achieved, but device complexity increases
Solution Approach 1:
The semiconductor substrate itself serves as the detection medium by exploiting its inherent electrical resistance properties. The substrate's resistance naturally varies when subjected to back side attacks (such as FIB etching), eliminating the need for separate complex detection structures and enabling a relatively simple detection system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively detects back side attacks by monitoring resistance changes, allowing for immediate intervention to stop the integrated circuit or delete confidential data, while being compatible with other attack detection systems.
Implementation Method 1
a system for detecting a variation of the resistance of the substrate between each association of two adjacent regions of the first conductivity type
Data Source
AI summary
An integrated circuit including: a semiconductor substrate of a first conductivity type having at least one well of a second conductivity type laterally delimited, on two opposite walls, by regions of the first conductivity type, defined at its surface; at least one region of the second conductivity type which extends in the semiconductor substrate under the well; and a system for detecting a variation of the substrate resistance between each association of two adjacent regions of the first conductivity type.