Integrated Circuit Backside Wiring for Lower Source Resistance

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Solution Overview

Problem

The increasing demand for high integration and reduced power consumption in semiconductor processes leads to increased parasitic effects from wires in integrated circuits, necessitating an efficient method for routing wires and vias to improve performance and reduce source resistance.

Innovation Solution

The integration circuit employs both frontside and backside wiring layers to transmit supply voltage, reducing routing complexity and source resistance without increasing the circuit area, by connecting parallel power rails to transistor sources through these layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If wire width and spacing are decreased to achieve higher integration density, then integration degree increases, but parasitic effects of wires increase

Engineering Contradiction:
Improveintegration densityVSAvoidparasitic effects
Core Design Contradiction:
Quantity of substanceVSObject-affected harmful factors

Solution Approach 1:

The patent introduces a backside wiring layer beneath the substrate, adding a new dimensional space for routing power and signal lines. This allows critical current paths to be formed using vias that penetrate or traverse the substrate, effectively moving wiring from a planar constraint to a three-dimensional configuration. The backside wiring layer enables power delivery without occupying additional planar area, thus maintaining high integration density while providing alternative current paths that reduce parasitic resistance and capacitance effects.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Use of energy by moving object

If power supply voltage is reduced to decrease power consumption, then power efficiency improves, but effects of parasitic elements become more significant

Engineering Contradiction:
Improvepower consumptionVSAvoidparasitic effects
Core Design Contradiction:
Use of energy by moving objectVSObject-affected harmful factors

Solution Approach 1:

By routing power supply lines through the backside wiring layer and using vertical vias to connect to frontside circuitry, the patent creates shorter and more direct current paths. This three-dimensional wiring approach reduces the length of power delivery networks, thereby minimizing parasitic resistance and inductance. The reduced parasitic effects ensure that even at lower operating voltages, sufficient current can be delivered to maintain proper circuit operation, enabling effective power management without sacrificing performance.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If routing is optimized to reduce parasitic effects, then performance improves, but routing complexity increases

Engineering Contradiction:
ImproveperformanceVSAvoidrouting complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent divides the wiring function into two separate layers: frontside wiring for signal routing and backside wiring for power delivery and interconnect. This segmentation allows each layer to be optimized independently for its specific function. The backside wiring layer handles high-current power paths and critical signal interconnects, while the frontside layer focuses on signal integrity and logic routing. This functional separation simplifies the overall routing complexity by preventing wire congestion and design rule conflicts that would arise from attempting to route all signals and power in a single planar layer.

Inventive Principle:
Principle #1Segmentation

4Area of stationary object

If wire dimensions are decreased to increase integration, then area efficiency improves, but source resistance of transistors increases

Engineering Contradiction:
Improvecircuit areaVSAvoidsource resistance
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The patent utilizes vertical vias that traverse the substrate to connect the backside wiring layer to frontside transistor sources. These vertical interconnects provide low-resistance current paths that are independent of planar wire dimensions. By delivering power through the substrate thickness rather than through narrow planar wires, the patent effectively reduces source resistance without consuming additional lateral area. This three-dimensional power delivery approach maintains compact circuit footprints while ensuring adequate current supply to transistor sources.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentEP4415034A1Integrated circuit including backside wiring and method of designing the integrated circuit
Publication Date: 2024.08.14 SAMSUNG ELECTRONICS CO LTD
  • EP4415034A1 patent drawingFigure 1
  • EP4415034A1 patent drawingFigure 2A
  • EP4415034A1 patent drawingFigure 2B

AI summary

An integrated circuit includes a power rail extending in a first direction and configured to receive a supply voltage, a gate line below the power rail and extending in a second direction that intersects the first direction, a source/drain region adjacent to the gate line in the first direction and configured to receive the supply voltage from the power rail, a frontside wiring layer above the power rail, connected to the power rail, and configured to transmit the supply voltage to the power rail, and a backside wiring layer below the power rail, connected to the power rail, and configured to transmit the supply voltage to the power rail.