Integrated Circuit Built-In Self-Test Circuitry for Noise Reduction
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Solution Overview
Problem
Built-in self-test circuits in integrated circuits have complex configurations, making them susceptible to noise and increasing the cost and time required for testing, which is not efficiently addressed by traditional automatic test equipment.
Innovation Solution
An integrated circuit with a test control circuit, driving circuit, and test detection circuit that generates and compares test command and address signals to detect intermediate test result values without external equipment, reducing complexity and noise susceptibility.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If built-in self-test circuits are used to reduce testing time and cost, then productivity is improved, but device complexity increases
Solution Approach 1:
The patent merges the test control circuit, driving circuit, and test detection circuit into an integrated built-in self-test system within the integrated circuit device. This consolidation enables the device to perform self-testing without external equipment, improving productivity while managing complexity through functional integration.
Solution Approach 2:
The built-in self-test circuit is designed to perform multiple test functions including generating test command signals, driving test operations, and detecting test results through intermediate values. This multi-functionality allows a single circuit structure to handle various testing requirements, enhancing productivity without proportionally increasing complexity.
2Productivity
If built-in self-test circuits are used to reduce testing time, then productivity is improved, but reliability deteriorates due to noise susceptibility
Solution Approach 1:
The patent introduces intermediate values as mediators in the test detection process. The test detection circuit detects these intermediate values generated during test operations to determine test results. This intermediary approach enables accurate test result detection while maintaining the speed benefits of built-in self-testing, resolving the conflict between productivity and reliability.
3Productivity
If built-in self-test circuits are used to reduce testing cost, then productivity is improved, but device complexity increases requiring more space
Solution Approach 1:
The patent segments the built-in self-test circuit into three functional modules: test control circuit, driving circuit, and test detection circuit. This segmentation allows for optimized space utilization by assigning specific functions to each module, reducing overall circuit complexity and space requirements while maintaining the cost benefits of built-in self-testing.
Data Source
AI summary
An integrated circuit includes a test control circuit, a driving circuit, and a test detection circuit. The test control circuit generates a test command signal and a test address signal corresponding to a test operation. The driving circuit performs the test operation by utilizing a test internal voltage, which is generated based on the test command signal. The test detection circuit compares the test address signal with target address information to output the test internal voltage.