Integrated Circuit Branch Segmentation for Low-Frequency Test Isolation
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Solution Overview
Problem
Current mass production screening tests for integrated devices, particularly at low frequencies, are ineffective in detecting failures in integrated circuits due to interference from other branches, leading to low yield and high costs associated with high-frequency tests.
Innovation Solution
An integrated circuit design with a first branch and a second branch, where the second end of the first branch is not connected to the second end of the second branch, allowing a low-frequency test signal to be applied between the first ends to isolate and effectively detect failures in the first branch without interference from the second branch.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If high-frequency test is used for mass production screening, then measurement precision is improved, but cost increases significantly
Solution Approach 1:
The patent changes the test frequency parameter from high-frequency to low-frequency range, achieving effective detection of integrated device failures while significantly reducing test equipment costs and making mass production screening economically viable
2Ease of manufacture
If low-frequency test is used for mass production screening, then cost is reduced, but measurement precision deteriorates due to interference from other branches
Solution Approach 1:
The patent segments the circuit branches by providing separate test terminals for each branch, allowing independent testing of individual branches at low frequency without interference from other branches, thereby maintaining detection accuracy while reducing test costs
Solution Approach 2:
The patent introduces separate test terminals as intermediary access points that enable isolated measurement of specific branches, preventing signal interference from other circuit branches during low-frequency testing
3Device complexity
If traditional two-terminal device design is used, then device complexity is reduced, but measurement precision deteriorates due to branch interference
Solution Approach 1:
The patent extends the two-terminal device design to include separate test terminals for each functional branch, creating isolated measurement paths that enable precise failure detection without requiring complex multi-terminal configurations or high-frequency testing
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enhances the yield of integrated circuits by accurately detecting failures at low cost, reducing the overall expense compared to high-frequency tests and enabling more efficient mass production.
Implementation Method 1
The first branch includes at least one first capacitor
Implementation Method 2
when a resistance is detected to be greater than a first preset threshold
Data Source
AI summary
Provided is an integrated circuit and a test method for an integrated circuit. The integrated circuit includes at least one first branch and at least one second branch. The first branch includes at least one first capacitor. The first end of the first branch is electrically connected to the first end of the second branch, and the second end of the first branch is not connected to the second end of the second branch, to conduct a low-frequency test. The low-frequency test includes application of a low-frequency test signal between the first end of the first branch and the second end of the first branch to test the first branch.