IC Cell Layout Verification Using Alternative Position Parameters

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Solution Overview

Problem

Standard cell design faces challenges due to design rule violations and rework caused by layout variants, which increase design time and computational resources, especially at advanced process nodes.

Innovation Solution

The implementation of a method for designing a method to improve the placeability of the cell design by providing a storage circuitry to store IC cell design, including alternative position parameters for layout variants, and performing verification operations using both position and alternative position parameters to reduce the likelihood of design rule violations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If layout variants are created to improve placeability, then the adaptability of cell placement is improved, but the complexity of verification increases

Engineering Contradiction:
ImproveplaceabilityVSAvoidverification complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by performing verification operations on alternative position parameters before finalizing the layout. The system stores multiple position parameters (first position parameters for primary layout, second position parameters for alternative layouts) and executes verification operations on each set beforehand, so that when the layout is placed, verification issues are already identified and resolved, reducing the complexity of subsequent verification steps.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If multiple position parameters are stored and verified, then the reliability of design rule compliance is improved, but the storage requirements and computational resources increase

Engineering Contradiction:
Improvedesign rule complianceVSAvoidstorage requirements
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The patent segments the verification process into distinct operations for different position parameter sets. Instead of verifying all possible layouts simultaneously, the system separates verification into: (1) verification of first position parameters for primary layout, and (2) verification of second position parameters for alternative layouts. This segmentation allows targeted verification of specific parameter sets, reducing overall computational resource requirements while maintaining comprehensive coverage.

Inventive Principle:
Principle #1Segmentation

3Reliability

If verification operations are performed on alternative position parameters, then the likelihood of catching design rule violations is improved, but the design time increases

Engineering Contradiction:
Improvedetection of design rule violationsVSAvoiddesign time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent implements continuity of useful action by integrating verification operations into the layout generation process itself. Rather than performing verification as a separate post-processing step, the system continuously verifies alternative position parameters as they are generated and stored. This continuous verification approach ensures that design rule violations are detected immediately, eliminating the need for time-consuming retrospective verification and reducing overall design time.

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS20250371243A1IC cell layout alternative geometry verification
Publication Date: 2025.12.04 ARM LTD
  • US20250371243A1 patent drawing
  • US20250371243A1 patent drawing
  • US20250371243A1 patent drawing

AI summary

Briefly, example apparatuses, articles of manufacture, and/or techniques are disclosed that may be implemented, in whole or in part, to implement, facilitate and/or support integrated circuit design, such as, an IC cell design including alternative position parameters associated with a subset of layer designs of the IC cell design.