Integrated Circuit Debugging Data Encryption
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Solution Overview
Problem
Debugging data collected using scan dump schemes in semiconductor chips is vulnerable to malicious access and use, lacking adequate security measures.
Innovation Solution
Integrated circuits and application processors are designed with built-in scanners and encryption circuits to collect and encrypt debugging data, using obfuscation and address rearrangement techniques to secure the data before storage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If scan dump scheme is used to collect debugging data, then test efficiency and debugging capability are improved, but security against malicious access deteriorates
Solution Approach 1:
The patent applies preliminary anti-action by implementing encryption circuits that encrypt debugging data before it can be accessed by malicious users. The encryption occurs proactively during the data collection process, preventing potential security breaches before they can occur. The scan dump scheme continues to collect data efficiently, but the data is simultaneously encrypted to counteract potential malicious access.
Solution Approach 2:
The patent introduces encryption circuits as an intermediary between the scan dump scheme and the stored debugging data. This intermediary component transforms the data into an encrypted form, acting as a protective barrier that maintains both the debugging capability and security. The encryption circuit serves as a mediator that preserves test efficiency while eliminating security vulnerabilities.
2Object-affected harmful factors
If encryption circuit is added to protect debugging data, then security against malicious access is improved, but device complexity increases
Solution Approach 1:
The patent merges the encryption circuit functionality with the existing scan dump scheme and test logics. By integrating the encryption function into the current debugging infrastructure, the patent avoids adding completely separate security systems. The encryption circuit is combined with the scanner and existing data pathways, reducing overall device complexity while maintaining security protection.
3Object-affected harmful factors
If encryption is applied to debugging data, then data security is improved, but ease of operation for debugging deteriorates
Solution Approach 1:
The patent implements self-service by enabling the system to automatically encrypt and manage its own debugging data without requiring external security management. The encryption circuit operates autonomously within the integrated circuit, automatically protecting data as it is collected. This self-encrypting capability maintains ease of operation for authorized debugging while providing robust security against malicious access.
Data Source
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AI summary
Disclosed is an integrated circuit including intellectual property (IP) pieces including test logics, respectively, a scanner configured to collect debugging data from the test logics of the IP pieces, and an encryption circuit configured to convert the debugging data into an encrypted data form.