Integrated Circuit Detection Circuit for Power-On Electrical Parameter Monitoring
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Solution Overview
Problem
Existing integrated circuit detection systems on printed circuit boards cannot accurately detect electrical parameters of specific integrated circuits, leading to undetected potential quality hazards when the board is in a power-on state.
Innovation Solution
A detection circuit connected to each integrated circuit on the printed circuit board, with first and second detection points, is used to detect electrical parameters such as total current, on-resistance, or voltage, allowing for determination of normalcy through a detection meter and processing module.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional board-level detection is used, then the detection system is simple and can detect board functional failures, but it cannot detect electrical parameters of specific integrated circuits or identify potential quality hazards in power-on state
Solution Approach 1:
The patent segments the detection system by introducing individual detection circuits for each integrated circuit on the printed circuit board. Each detection circuit includes detection points connected to specific IC pins, enabling isolated measurement of electrical parameters (voltage, current, resistance) for each IC. This segmentation transforms the undetectable board-level measurement into separable, precise IC-level measurements, resolving the contradiction between detection precision and system complexity.
Solution Approach 2:
The patent introduces detection circuits as intermediary components between the integrated circuits and the detection meter. These intermediaries include detection points (first and second detection points) that connect to IC power and signal pins, and detection circuits that condition and transmit signals. This intermediary layer enables precise electrical parameter measurement without requiring direct modification of the ICs themselves, achieving high detection precision while maintaining manageable system complexity.
2Adaptability or versatility
If detection is performed only in functional test mode, then the detection system remains simple, but electrical parameters cannot be measured in power-on state leading to undetected quality hazards
Solution Approach 1:
The patent creates a universal detection system that functions in multiple states: both functional test mode and power-on state. The detection circuits are designed to operate regardless of the overall board state, with detection points that can measure electrical parameters during power-on conditions. This multi-functionality allows the same detection system to serve both traditional functional testing and new power-on parameter monitoring, achieving adaptability without proportionally increasing complexity.
Solution Approach 2:
The patent implements preliminary detection capability by designing detection circuits that can measure electrical parameters before functional failures manifest. The detection points are positioned to monitor voltage, current, and resistance in real-time during power-on state, enabling early detection of abnormal electrical conditions that precede functional failures. This preliminary action capability expands adaptability while maintaining relatively simple detection circuit architecture.
Data Source
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AI summary
An integrated circuit detection method, apparatus, and system are disclosed, which relate to the field of electronics and resolve a problem of detecting an electrical parameter of an integrated circuit on a printed circuit board in a power-on state. A specific solution is as follows: N detection circuits (101) are disposed, where each detection circuit (101) is connected to a different integrated circuit (102), the detection circuit (101) is provided with a first detection point (a) and a second detection point (b), and the detection circuit (101) is configured to detect the electrical parameter of the integrated circuit (102) that is connected to the detection circuit (101); and N is an integer greater than or equal to 1. The solution is used in a process of detecting the electrical parameter of the integrated circuit on the printed circuit board.