Integrated Circuit Digital Test Line for Analog Control Signal Verification
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Solution Overview
Problem
Testing control lines in modern integrated circuits, particularly in analog circuit areas, is time-consuming and economically challenging due to the need for extensive analog voltage measurements, which significantly prolongs the overall chip testing time.
Innovation Solution
Implementing a digital test method using a test line that feeds back a compressed signal to the digital circuit area, allowing for faster testing of control lines by utilizing level converters and data compression circuits, such as EXOR gates, to reduce the number of test lines and drivers needed, thereby accelerating the testing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If analog voltage measurements are used to test control lines in the analog circuit area, then measurement precision is improved, but testing time increases significantly
Solution Approach 1:
The patent replaces the mechanical/electrical analog measurement system with a digital testing system. By converting analog control signals to digital test signals and using digital logic circuits (such as XOR gates) to evaluate the control lines, the system achieves both high measurement precision and fast testing speeds, eliminating the time-consuming nature of traditional analog voltage measurements.
2Adaptability or versatility
If the number of control lines is increased to control more trimming bits, then device functionality is improved, but testing complexity increases
Solution Approach 1:
The patent merges multiple control line tests into a single digital test signal evaluation. By using logic circuits such as XOR gates to combine the states of multiple control lines into a single digital output, the system can test numerous control lines simultaneously through one digital test signal, thereby reducing testing complexity while maintaining the ability to control multiple trimming bits.
Solution Approach 2:
The digital test signal evaluation system serves multiple functions: it can test any combination of control lines by configuring the digital logic circuitry, evaluate both individual and combined control line states, and adapt to different testing scenarios. This universal approach allows the same testing mechanism to handle varying numbers of control lines and trimming bits without increasing complexity.
Data Source
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AI summary
The invention relates to an integrated circuit (1). The integrated circuit (1) comprises a digital circuit region (10) which comprises a digital circuit (15). The integrated circuit (15) further comprises an analog circuit region (20) which is physically separated from the digital circuit region (10) and which comprises an analog circuit (25). The integrated circuit (1) additionally comprises a control line (S1) for transmitting a control signal (S[1]) from the digital circuit (15) to the analog circuit (25), and the integrated circuit (1) additionally comprises a test analysis unit (12) which is integrated into the digital circuit region (10). The integrated circuit (1) further comprises a test line (T1) which is connected to the control line (S1) in an electrically conductive manner within the analog circuit region (20) and which is connected to the test analysis unit (12) in an electrically conductive manner, wherein the test analysis unit (12) is designed to test the digital value of a signal returned via the test line (T1).