Integrated Circuit Isolation Error Checking via Power Domain Extraction
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Solution Overview
Problem
Current methods for testing isolation values of isolation cells in integrated circuits are time-consuming and resource-intensive, requiring significant computational resources and expertise.
Innovation Solution
An operating method for an electronic device that simulates an integrated circuit design, using processors to obtain power domain structures, current and reference isolation values, and reset values to quickly check isolation errors by comparing these values.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If related art methods are used to test isolation values of isolation cells, then comprehensive testing can be performed, but it requires a long time and a lot of computation resources
Solution Approach 1:
The patent extracts only the critical isolation value parameters from the full RTL model for testing, rather than performing comprehensive simulation of the entire integrated circuit. By obtaining isolation values from specific power domain structures and comparing them against expected values, the method achieves reliable isolation error detection while significantly reducing testing time and computational resource requirements.
2Reliability
If related art methods are used to test isolation values of isolation cells, then comprehensive testing can be performed, but it requires a lot of computation resources such as memory and processing resources
Solution Approach 1:
The patent extracts only the critical isolation value parameters from the full RTL model for testing, rather than performing comprehensive simulation of the entire integrated circuit. By obtaining isolation values from specific power domain structures and comparing them against expected values, the method achieves reliable isolation error detection while significantly reducing testing time and computational resource requirements.
Solution Approach 2:
The patent segments the isolation testing process into distinct steps: obtaining power domain structure, extracting current isolation values, obtaining expected isolation values, and comparing them. This segmentation allows the testing to focus only on isolation-related parameters rather than simulating the entire circuit, thereby reducing memory and processing resource requirements while maintaining testing reliability.
3Loss of energy
If isolation cells are placed at ports between power domains to isolate powered-off domains, then power consumption can be reduced, but isolation errors may occur if isolation values are incorrectly specified
Solution Approach 1:
The patent implements a feedback mechanism by comparing the currently obtained isolation values against expected isolation values derived from the power domain structure. This feedback loop automatically detects isolation errors when isolation values are incorrectly specified, ensuring that power domain isolation reliability is maintained while still enabling power consumption reduction through selective powering off of domains.
Data Source
AI summary
Disclosed is an operating method of an electronic device which simulates a design of an integrated circuit. The method includes detecting, at the electronic device, a power domain structure of the integrated circuit from a register transfer level (RTL) model of the integrated circuit, detecting, at the electronic device, current isolation values of ports of the integrated circuit from the power domain structure of the integrated circuit and an unified power format (UPF) of the integrated circuit, detecting, at the electronic device, reference isolation values of the ports of the integrated circuit, detecting, at the electronic device, reset values of the ports of the integrated circuit, and checking, at the electronic device, isolation errors of the ports of the integrated circuit based on the current isolation values, the reference isolation values, and the reset values.