IC Package Isolation Holes for High Density I/O

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Solution Overview

Problem

Conventional semiconductor package solutions face challenges in achieving high density and high count I/O while maintaining low manufacturing costs and improved reliability, especially in the miniaturization of portable electronic devices.

Innovation Solution

The integrated circuit package system includes connecting an integrated circuit die and external interconnects, forming an encapsulation over the die and a portion of the interconnects, and creating isolation holes between the interconnects and the encapsulation to expose them, allowing for increased I/O density and flexibility in packaging configurations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If conventional QFN packages are used with traditional molding and lead frame structures, then manufacturing cost is reduced, but I/O density and I/O count are limited

Engineering Contradiction:
ImproveI/O countVSAvoidpackage structure complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The package structure is segmented into distinct functional zones: an exposed pad area for I/O connections, a die attach area, and isolation regions. The isolation holes segment the encapsulation material to expose specific interconnect regions, allowing high-density I/O without requiring complex diagonal tie bar structures.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention transitions from traditional lateral I/O arrangements to a configuration where I/O interconnects are exposed through the thickness dimension of the package via isolation holes. This vertical exposure approach enables higher I/O density without increasing the package footprint or requiring complex lateral routing structures.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Volume of moving object

If the package is miniaturized and thinned to reduce device size, then portability is improved, but manufacturing reliability deteriorates

Engineering Contradiction:
Improvepackage sizeVSAvoidmanufacturing reliability
Core Design Contradiction:
Volume of moving objectVSReliability

Solution Approach 1:

The encapsulation material has different properties in different regions: areas with isolation holes have exposed interconnects for I/O access, while other areas maintain full encapsulation for protection. The die attach paddle provides localized mechanical support and thermal management where needed, while allowing miniaturization in other regions.

Inventive Principle:
Principle #3Local quality

3Quantity of substance

If more I/O interconnects are packed into the package, then I/O density increases, but manufacturing complexity increases

Engineering Contradiction:
ImproveI/O densityVSAvoidmanufacturing ease
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The molding process automatically forms the encapsulation material around the die and lead frame, and the isolation holes are formed through the cured encapsulation to expose the I/O interconnects. This self-organizing process allows high I/O density without requiring complex manual assembly or additional manufacturing steps.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS8421198B2Integrated circuit package system with external interconnects at high density
Publication Date: 2013.04.16 STATS CHIPPAC LTD
  • US8421198B2 patent drawing
  • US8421198B2 patent drawing
  • US8421198B2 patent drawing

AI summary

An integrated circuit package system includes: connecting an integrated circuit die and external interconnects; forming an encapsulation over the integrated circuit die and a portion of the external interconnects; and forming an isolation hole between the external interconnects and into a side of the encapsulation exposing the external interconnects.