IC Package Via Bonding for Parasitic Reduction

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Solution Overview

Problem

Current semiconductor packaging technologies face challenges in minimizing the form factor and electrical parasitics, particularly at higher frequencies, with wire-based interconnections limiting frequency performance and bump-based interconnections being costly and inflexible.

Innovation Solution

The integrated circuit package system employs a substrate with a plated via forming a conductor having a closed end, allowing direct electrical connection of the integrated circuit die to the substrate, reducing parasitics and eliminating the need for additional covering materials.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If wire-based interconnection is used to connect chip to carrier, then ease of manufacture and design flexibility are improved, but electrical parasitics increase and frequency performance deteriorates

Engineering Contradiction:
Improveease of manufactureVSAvoidelectrical parasitics
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent extracts the harmful wire loop structure from the interconnection path and replaces it with a direct bonded wire configuration. The wire is bonded directly from chip pad to carrier pad without forming a loop, eliminating the primary source of inductance while maintaining the ease of wire-based manufacturing and design flexibility.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent transitions from a planar wire loop interconnection to a three-dimensional bonded wire structure that passes through a via in the substrate. This dimensional change allows the wire to achieve a shorter electrical path with reduced inductance while maintaining connectivity between chip and carrier.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Object-affected harmful factors

If bump-based interconnection is used to connect chip to carrier, then electrical parasitics are reduced and frequency performance is improved, but manufacturing complexity and cost increase

Engineering Contradiction:
Improveelectrical parasiticsVSAvoidmanufacturing complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent introduces a substrate with plated vias as an intermediary structure between the chip and carrier. This substrate provides pre-formed conductive paths that guide the bonded wire from chip pad to carrier pad, achieving low parasitic performance similar to bump-based interconnection while maintaining the simplicity of wire bonding processes.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Adaptability or versatility

If wire loop interconnection is used, then design flexibility is maintained, but inductance increases and frequency limit is reduced

Engineering Contradiction:
Improvedesign flexibilityVSAvoidfrequency limit
Core Design Contradiction:
Adaptability or versatilityVSSpeed

Solution Approach 1:

The patent removes the wire loop configuration that causes high inductance and replaces it with a direct bonded wire path through the substrate. This extraction of the harmful loop structure maintains design flexibility while enabling operation at higher frequencies by reducing the inductance to minimal levels.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances electrical performance by providing a shorter interconnection path and reduces costs associated with material coverage, while maintaining design flexibility and structural integrity.

Implementation Method 1

forming a conductor in the opening provided in the substrate

Methodology Applied
Scientific EffectElectrical Conduction: Conduction (electrical)

Implementation Method 2

bonding in via

Methodology Applied
Scientific EffectBonding: Welding

Data Source

PatentUS9000579B2Integrated circuit package system with bonding in via
Publication Date: 2015.04.07 STATS CHIPPAC LTD
  • US9000579B2 patent drawing
  • US9000579B2 patent drawing
  • US9000579B2 patent drawing

AI summary

An integrated circuit package system includes a substrate having an opening provided therein, forming a conductor in the opening having a closed end at the bottom, attaching an integrated circuit die over the substrate, and connecting a die interconnect to the integrated circuit die and the closed end of the conductor.