Integrated IC Power-Up Testing Device for Issue Detection
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Solution Overview
Problem
Existing IC test devices are unable to effectively integrate power-up and subsequent functional tests, making it difficult to detect issues in the power-up process due to different test environments, which can affect subsequent functional tests.
Innovation Solution
A power-up testing method and device that obtain and generate power-up testing parameters and waveforms to create test instances, allowing for integrated power-up and functional testing, with the ability to simulate various IC power-up scenarios and interpret results from a single functional test device.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If power-up testing and functional testing are performed using separate devices, then each device can be optimized for its specific function, but it becomes difficult to determine whether test failures are caused by power-up issues or functional issues
Solution Approach 1:
The patent combines power-up testing and functional testing into a single integrated test device. The test device includes a power-up testing unit that can generate power-up waveforms and a functional testing unit that can execute functional test programs, both within the same device architecture. This integration allows the system to perform both power-up and functional tests without requiring separate devices, enabling accurate identification of whether test failures originate from power-up issues or functional issues while maintaining a unified testing platform.
2Productivity
If multiple test devices are used for power-up and functional testing, then specific functionalities can be tested with specialized equipment, but the testing process becomes more complex and less efficient
Solution Approach 1:
The test device is designed with multi-functionality to perform both power-up testing and functional testing. The device includes a configuration unit that can be set to different modes (power-up testing mode or functional testing mode), a power-up testing unit with waveform generation capabilities, and a functional testing unit that can execute various functional test programs. This universal design allows a single device to replace multiple specialized devices, improving testing efficiency while maintaining the ability to perform both types of tests with appropriate configurations.
3Reliability
If power-up testing is integrated into the functional test device, then issue detection becomes more accurate, but the device complexity increases
Solution Approach 1:
The test device is segmented into distinct functional units: a configuration unit for setting test modes and parameters, a power-up testing unit with waveform generation and control capabilities, a functional testing unit for executing functional test programs, and a result output unit. This segmentation allows each unit to be optimized for its specific function while working together as an integrated system. The modular architecture enables accurate issue detection by clearly separating power-up testing functions from functional testing functions, making it easier to identify whether failures originate from power-up issues or functional issues.
Data Source
AI summary
An integrated circuit (IC) power-up testing method, an IC power-up testing device, a storage medium and an electronic equipment are disclosed. The IC power-up testing method includes: obtaining power-up testing parameters for an IC; obtaining a plurality of power-up testing waveforms; generating a plurality of power-up test instances by conducting parameter assignments for the power-up testing waveforms based on the power-up testing parameters; and performing power-up tests on the IC using the plurality of power-up test instances. The method allows simulating various IC power-up scenarios through a plurality of power-up test instances.