IC Parameter Trimming via Reference Mapping for Faster Calibration
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Solution Overview
Problem
The existing trimming processes for electronic devices, particularly Integrated Circuits (ICs), are time-consuming and inefficient due to the need for individual measurement and correction of functional parameters, which can be difficult when parameters are not directly available outside the IC, and lack the ability to discriminate between parameters requiring different trimming accuracies.
Innovation Solution
A many-to-one mapping approach is implemented, where corrections for reference parameters are used to infer and apply trimming actions to non-reference parameters, allowing for different trimming accuracies and eliminating the need to measure non-reference parameters directly, by using a predefined relationship to select and apply trimming actions across multiple parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If individual measurement and correction of each functional parameter is performed, then trimming accuracy is improved, but trimming time and process complexity increase
Solution Approach 1:
The patent segments parameters into two categories: reference parameters (measured individually) and non-reference parameters (corrected via mapping). This segmentation allows selective application of time-consuming measurement procedures only to critical parameters while using efficient mapping for others, thereby reducing overall trimming time while maintaining accuracy for key parameters.
Solution Approach 2:
Instead of measuring and correcting all parameters individually (excessive action), the patent applies partial action by measuring only reference parameters and inferring corrections for non-reference parameters through mapping. This partial approach significantly reduces trimming time while providing sufficient accuracy for non-critical parameters.
2Manufacturing precision
If individual measurement and correction of each functional parameter is performed, then parameter correction accuracy is improved, but device complexity increases
Solution Approach 1:
The patent creates a universal mapping relationship that can be applied to multiple non-reference parameters simultaneously. This single mapping mechanism serves multiple correction purposes, reducing the need for separate measurement and correction circuits for each parameter, thereby simplifying the overall device complexity while maintaining correction capability.
Solution Approach 2:
The patent uses the measured values of reference parameters as copies or proxies to infer the values of non-reference parameters. Instead of directly measuring each parameter (which would require complex measurement circuits), the system creates indirect copies through mathematical mapping relationships, significantly reducing measurement system complexity.
3Measurement precision
If direct measurement of non-reference parameters is performed, then measurement accuracy is improved, but additional circuitry and complexity are required
Solution Approach 1:
The patent introduces reference parameters as intermediary variables that mediate between direct measurements and indirect corrections. Instead of directly measuring difficult-to-access non-reference parameters (which would require additional circuitry), the system uses easily measurable reference parameters as intermediaries to infer the values of non-reference parameters through mapping relationships.
Solution Approach 2:
The patent creates indirect copies of non-reference parameter values through mathematical mapping from reference parameters. Instead of implementing complex direct measurement circuits for each non-reference parameter, the system generates accurate copies via computation, eliminating the need for additional physical measurement circuitry.
4Ease of operation
If proportional correction is applied to all parameters, then trimming process simplicity is improved, but ability to discriminate different parameter criticalities is lost
Solution Approach 1:
The patent applies local quality by assigning different correction strategies to different parameter categories. Reference parameters (which are more critical) receive individual measurement and correction, while non-reference parameters (less critical) receive mapping-based correction. This localized differentiation maintains process simplicity while enabling accuracy discrimination based on parameter criticality.
Solution Approach 2:
The patent changes the correction approach parameter based on the parameter's criticality. For reference parameters, full measurement and correction is applied; for non-reference parameters, efficient mapping correction is used. This parameter-dependent strategy provides both simplicity and adaptability by adjusting the correction methodology according to each parameter's importance.
Data Source
AI summary
An embodiment of an electronic device having a plurality of trimmable operative parameters is provided. The electronic device includes a trimming circuit for applying a plurality of trimming actions to each parameter for causing a corresponding correction of the parameter, for at least one reference parameter, a measuring circuit for measuring the reference parameter responsive to the application of at least part of the trimming actions, and for forcing the application of the selected trimming action for the reference parameter. For each non-reference parameter different from the at least one reference parameter, the electronic device includes a selection circuit for selecting one of the trimming actions for the non-reference parameter corresponding to the selected trimming action for the at least one reference parameter, and a biasing circuit for forcing the application of the selected trimming action for each non-reference parameter.