Integrated Circuit Trimming via Reference-to-Parameter Correction Mapping
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Solution Overview
Problem
The existing trimming processes for electronic devices, particularly Integrated Circuits (ICs), are time-consuming and inefficient due to the need to measure and correct each functional parameter individually, and they fail to accurately discriminate between parameters requiring different trimming processes, especially when parameters are not directly available outside the IC.
Innovation Solution
A many-to-one mapping approach is implemented, where corrections for reference parameters are used to infer and apply trimming actions to non-reference parameters, allowing for different accuracy levels and eliminating the need to measure non-reference parameters directly, by using a predefined relationship to select and apply trimming actions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If individual measuring and correcting operations are applied to each functional parameter, then measurement precision is improved, but productivity deteriorates due to time-consuming processes
Solution Approach 1:
The patent segments functional parameters into two categories: reference parameters (directly measurable) and non-reference parameters (not directly measurable). This segmentation allows the trimming system to measure only reference parameters individually while deriving corrections for non-reference parameters through a mapping relationship, thereby reducing the number of individual measuring operations required and improving productivity while maintaining adequate measurement precision.
Solution Approach 2:
The patent introduces a mapping relationship as an intermediary mechanism that connects reference parameters to non-reference parameters. Instead of directly measuring each non-reference parameter, the system uses the mapping relationship to infer their values from measured reference parameters, significantly reducing measurement time and improving productivity while preserving acceptable measurement precision through the mathematical relationship.
2Manufacturing precision
If individual measuring and correcting operations are applied to each functional parameter, then manufacturing precision is improved, but loss of time increases due to sequential processing
Solution Approach 1:
The patent segments the trimming process into two phases: (1) measuring and correcting reference parameters individually to ensure manufacturing precision, and (2) deriving corrections for non-reference parameters through mapping relationships. This segmentation maintains manufacturing precision for critical reference parameters while reducing overall trimming time by avoiding individual measurement of non-reference parameters.
Solution Approach 2:
The patent establishes mapping relationships between reference and non-reference parameters in advance (before the trimming process). This preliminary action allows the system to quickly derive non-reference parameter corrections from reference parameter measurements without performing time-consuming individual measurements, thereby reducing loss of time while maintaining manufacturing precision through the pre-established mathematical relationships.
3Measurement precision
If additional circuitry is provided to measure non-reference parameters, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent makes reference parameters serve multiple functions: they are not only measured directly for trimming purposes but also serve as the basis for deriving non-reference parameter values through mapping relationships. This multi-functionality eliminates the need for additional dedicated measurement circuitry for non-reference parameters, thereby reducing device complexity while maintaining adequate measurement precision through the mathematical mapping.
Solution Approach 2:
The patent creates a mathematical copy (mapping relationship) of the relationship between reference and non-reference parameters. Instead of physically measuring non-reference parameters with additional circuitry, the system creates and uses a mathematical model that copies the behavioral relationship, thereby reducing device complexity while preserving measurement precision through the mathematical representation.
4Ease of manufacture
If proportional correction is applied to all reference-voltage generators, then ease of manufacture is improved, but manufacturing precision deteriorates for parameters with different criticality
Solution Approach 1:
The patent applies local quality by allowing different trimming approaches for different parameter categories: reference parameters receive individual measuring and correcting operations with high manufacturing precision, while non-reference parameters receive corrections derived through mapping relationships. This localized differentiation maintains ease of manufacture through the mapping approach for non-critical parameters while ensuring high manufacturing precision for critical reference parameters.
Solution Approach 2:
The patent applies partial action by not measuring and correcting all functional parameters with the same level of detail. Instead, it focuses individual measuring and correcting operations on critical reference parameters while using mapping relationships for non-critical non-reference parameters. This partial approach maintains ease of manufacture while achieving sufficient manufacturing precision for each parameter category based on its criticality.
Data Source
AI summary
An integrated circuit includes a first storage location, a first generator, a converter, and a second generator. The first storage location is operable to store a first adjustment value. The first generator is coupled to the first storage location, is operable to generate a first signal having a first characteristic, and includes a first adjuster operable to change the first characteristic in response to the first adjustment value. The converter is coupled to the first storage location and is operable to generate from the first adjustment value a modified adjustment value. The second generator is coupled to the converter, is operable to generate a second signal having a second characteristic, and includes a second adjuster operable to change the second characteristic in response to the modified adjustment value.