Integrated Circuit Reference Sub-System for Deterioration Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Integrated circuits face challenges in maintaining reliability and preventing component or sub-system failure over time, particularly in sensitive applications like vehicles and medical devices, where deterioration can lead to malfunction.
Innovation Solution
Incorporating a reference sub-system or elementary structure that is not active by default, allowing for continuous monitoring and comparison with the primary sub-system or elementary structure to detect deterioration, and seamlessly switching to the reference system upon detection of significant degradation to prevent failure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a reference sub-system is added to monitor and replace the primary sub-system, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent creates a reference sub-system that is substantially identical to the primary sub-system, serving as a redundant backup. This copy can replace the primary sub-system when deterioration is detected, thereby improving reliability without requiring a completely different backup mechanism
Solution Approach 2:
The reference sub-system is prepared in advance and kept in a ready state before failure occurs. The system continuously monitors the primary sub-system's health parameters and pre-configures the reference sub-system to take over immediately when deterioration thresholds are exceeded, eliminating the need for complex real-time failure response mechanisms
2Reliability
If continuous monitoring and comparison is performed to detect deterioration early, then reliability is improved, but use of energy increases
Solution Approach 1:
The patent implements a feedback mechanism where the test circuit continuously monitors parameters of both the primary and reference sub-systems, compares them, and provides feedback to the control circuit. This feedback loop enables early detection of deterioration while optimizing energy usage by only activating the reference sub-system when actually needed
Solution Approach 2:
The monitoring and comparison operations are performed periodically rather than continuously, allowing the system to detect deterioration trends over time while reducing energy consumption. The control circuit schedules parameter comparisons at intervals, balancing detection effectiveness with energy efficiency
3Use of energy by moving object
If the reference sub-system is kept inactive by default, then use of energy is reduced, but the ability to detect deterioration is worsened
Solution Approach 1:
The reference sub-system is configured and tested in advance during manufacturing, with all necessary parameters measured and stored. This preliminary setup allows the inactive reference sub-system to serve as a valid comparison baseline when activated, enabling deterioration detection without requiring continuous operation of the reference system
Solution Approach 2:
The test circuit acts as an intermediary that can temporarily activate the reference sub-system for comparison purposes without requiring it to remain continuously active. This intermediary mechanism allows periodic verification of the reference sub-system's functionality and enables deterioration detection while maintaining energy efficiency
Data Source
AI summary
An integrated circuit includes a sub-system and a reference sub-system. The reference sub-system is substantially identical to the sub-system but is non-operating by default. The integrated circuit includes a test circuit that obtains a parameter value of the sub-system and a reference parameter from the reference sub-system. The integrated circuit detects deterioration of the sub-system based on the parameter value and the reference parameter. The integrated circuit deactivates the sub-system and activates the reference sub-system responsive to detecting deterioration of the sub-system.