Reinforced IC Seal Ring Layout for Singulation Stress Protection
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Solution Overview
Problem
Multi-gate semiconductor devices, such as FinFETs and MBC transistors, are prone to damage from mist ingress and stress during the singulation process due to inadequate mechanical strength and stress absorption in existing seal structures, particularly in metal lines with dimensions smaller than 1 μm.
Innovation Solution
The integration of a seal ring structure with metal line loops and lateral connectors in the interconnect structure, where the metal line loops completely encircle the device portion and are laterally connected by connectors perpendicular to their longitudinal direction, enhancing mechanical integrity and stress absorption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of moving object
If metal line dimensions are reduced to smaller than 1 μm to enable scaling, then device density and integration are improved, but mechanical strength and stress absorption of seal structures deteriorate
Solution Approach 1:
The seal ring structure is segmented into multiple components: a first seal ring, a second seal ring, and multiple tie bars connecting them. This segmentation allows each component to be optimized independently while collectively providing enhanced mechanical strength despite reduced metal line dimensions
Solution Approach 2:
The seal structure uses composite construction with multiple metal line loops and connecting tie bars forming a reinforced composite structure. This composite design provides superior mechanical strength and stress absorption compared to single-loop seal structures of the same scale
2Ease of manufacture
If existing seal structures are used without reinforcement, then manufacturing simplicity is maintained, but protection against mist ingress and stress during singulation is insufficient
Solution Approach 1:
The reinforced seal ring structure is formed as part of the interconnect structure before singulation. The multiple metal line loops and tie bars are preliminarily constructed to provide stress absorption and protection against mist ingress during the subsequent singulation process
Solution Approach 2:
The tie bars and multiple seal rings provide beforehand cushioning by absorbing stress and preventing mist ingress during singulation. This protective function is built into the structure in advance to cushion against harmful effects during manufacturing
Data Source
AI summary
Integrated circuit (IC) chips and seal ring structures are provided. An IC chip according to the present disclosure includes an interconnect structure that includes a first metal line, a second metal line, a third metal line, a fourth metal line, and a fifth meal line extending along a first direction, a first group of lateral connectors disposed between the second metal line and the third metal line or between the fourth metal line and the fifth metal line, and a second group of lateral connectors disposed between the first metal line and the second metal line or between the third metal line and the fourth metal line.


