Integrated Circuit Sensitivity Analysis Using Dynamic Parameter Grouping

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Solution Overview

Problem

Current circuit sensitivity analysis methods, such as the 'brute-force' one-factor-at-a-time method, are computationally expensive and time-consuming, requiring a large number of simulations to predict circuit performance metrics variations, making them impractical for complex integrated circuit designs.

Innovation Solution

A design tool apparatus and method that uses a simulation engine, sensitivity optimisation engine, and sensitivity calculator to perform circuit sensitivity analysis by grouping devices and process parameters into dynamic lists, allowing for early stage termination based on tolerance values, reducing the number of simulations needed.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the one-factor-at-a-time (brute-force) method is used for circuit sensitivity analysis, then the sensitivity of each process parameter can be calculated individually, but the computational cost and time required increase significantly

Engineering Contradiction:
Improvesensitivity calculation accuracyVSAvoiddesign efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent segments the sensitivity analysis process by dividing process parameters into different groups (first group and second group) and analyzing them in separate phases. This allows the system to focus computational resources on the most influential parameters first, thereby reducing overall computational cost while maintaining accuracy for critical parameters.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs preliminary sensitivity analysis on a first group of process parameters before analyzing the second group. By identifying and analyzing the most influential parameters first, the system can make early decisions about design optimizations without requiring complete analysis of all parameters, thus improving design efficiency.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If all process parameters are analyzed in detail, then comprehensive sensitivity information is obtained, but the number of simulations required becomes impractically large

Engineering Contradiction:
Improvecircuit performance prediction accuracyVSAvoidanalysis time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent divides the complete set of process parameters into multiple groups and analyzes them in sequential phases. This segmentation allows the system to obtain reliable sensitivity information for critical parameters while avoiding the prohibitive computational cost of analyzing all parameters with equal detail.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs sensitivity analysis on a subset of process parameters (the first group) with higher priority or influence on circuit performance. This partial action approach provides sufficient reliability for design decisions without requiring exhaustive analysis of all parameters, thereby reducing analysis time significantly.

Inventive Principle:
Principle #16Partial or excessive action

3Measurement precision

If multiple simulations are performed to account for process parameter variations, then circuit performance metrics can be predicted, but the computational burden increases

Engineering Contradiction:
Improveperformance metrics prediction accuracyVSAvoidcomputational resources
Core Design Contradiction:
Measurement precisionVSUse of energy by moving object

Solution Approach 1:

The patent segments the simulation process into multiple phases, performing sensitivity analysis on different groups of process parameters separately. This allows computational resources to be allocated efficiently, focusing intensive simulation on the most influential parameters while using simpler analysis for less critical parameters.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9922146B2Tool apparatus, method and computer program for designing an integrated circuit
Publication Date: 2018.03.20 NXP USA INC
  • US9922146B2 patent drawing
  • US9922146B2 patent drawing
  • US9922146B2 patent drawing

AI summary

An integrated circuit design tool apparatus includes a processing resource configured to support a circuit simulator, a circuit sensitivity optimizer and a circuit sensitivity calculator. The circuit sensitivity optimizer is adapted to communicate to the circuit simulator a first dynamic list of selected devices of the circuit; and a second dynamic list of selected process parameters associated with the selected devices of the first dynamic list. The circuit simulator is configured to communicate to the circuit sensitivity calculator, a performance metrics of the circuit in response thereto. The circuit sensitivity calculator is configured to determine one sensitivity coefficient for each device of the first dynamic list in response thereto. The circuit sensitivity calculator is further configured to determine and communicate to the circuit sensitivity optimizer a variance of the performance metrics and also adapted to gradually determine whether or not to further communicate with the circuit simulator.