Dynamic IC Simulation Parameter Adjustment for Test Coverage
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Solution Overview
Problem
Traditional integrated circuit verification processes are time-consuming and inefficient, requiring significant human supervision and manual intervention, as they struggle to ensure complete coverage of all input stimuli, leading to bottlenecks in testing systems.
Innovation Solution
A method and system that dynamically adjust simulation test cycle parameters during runtime to achieve and verify a target test coverage value, using automated processes to optimize the verification of integrated circuit designs by recalculating and modifying parameters such as input stimuli and random number generator seeds, allowing for real-time monitoring and adjustment of test parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If traditional randomized testing approaches are used with multiple iterations, then coverage of input stimuli can be improved, but testing time and human supervision requirements increase significantly
Solution Approach 1:
The patent implements dynamic adjustment of test parameters during simulation runtime. The system monitors coverage metrics in real-time and automatically modifies test parameters such as random seed values, stimulus constraints, and simulation depth to optimize coverage achievement while reducing overall testing time.
Solution Approach 2:
The system incorporates continuous feedback loops that monitor test coverage metrics during simulation execution. Based on this feedback, the system automatically adjusts test parameters and directs testing resources to uncovered areas, eliminating the need for manual intervention and reducing total testing time while maintaining high coverage.
2Manufacturing precision
If traditional testing approaches are used, then complete coverage may eventually be achieved, but the process requires constant human supervision and manual intervention
Solution Approach 1:
The patent implements a self-service testing system that automatically monitors coverage metrics, identifies uncovered test scenarios, and adjusts test parameters without human intervention. The system autonomously manages the entire verification process including test generation, execution, coverage analysis, and parameter optimization.
Solution Approach 2:
Continuous automated feedback mechanisms track coverage status and trigger automatic adjustments to test parameters. The system uses this feedback loop to independently optimize testing efficiency and achieve complete coverage without requiring human supervision or manual parameter tuning.
3Productivity
If test parameters are fixed before simulation, then setup time is reduced, but the ability to achieve desired coverage is limited without multiple iterations
Solution Approach 1:
The system transitions from static pre-defined test parameters to dynamic parameters that adjust during simulation execution. Test parameters such as random seeds, stimulus patterns, and simulation depth are modified in real-time based on coverage feedback, enabling the system to adapt to uncovered scenarios and achieve complete coverage more efficiently.
Solution Approach 2:
The patent implements automatic parameter changes during simulation based on coverage analysis. The system modifies test parameters including random number generator seeds, stimulus constraints, and simulation depth dynamically to target uncovered functionality, thereby improving coverage achievement without requiring multiple complete simulation iterations.
Data Source
AI summary
The present invention pertains to a method of verifying a design of an integrated circuit. The methods executes an iteration of simulation test cycle using a digital representation of the design. Next, the method obtains simulation results from the iteration of the simulation test cycle and calculates, during the simulation test cycle, a test coverage value associated with the simulation results of the iteration of the simulation test cycle. If the test coverage value is less than a target value, the method determines if the simulation test cycle fails to satisfies an iteration limiting metric. If the simulation test cycle satisfies the iteration limiting metric, the method, dynamically adjusts one or more simulation test cycle parameter during the simulation test cycle and iterates the simulation test cycle and recalculating the test coverage value until the test coverage value is at least the target value or the simulation test cycle fails to satisfy the iteration limiting metric. The method then out puts a result of the verification of the design.