Integrated Circuit Startup Sequencing for Low-Temperature Operation
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Solution Overview
Problem
The increasing number of transistors in integrated circuit devices due to size reduction and higher speeds makes it difficult to design for high-speed operation across a wide temperature range from lower to higher temperatures.
Innovation Solution
Incorporating a startup operation circuit and a post-startup operation circuit with different guaranteed temperature ranges, where the post-startup operation circuit starts only after the integrated circuit device reaches a threshold temperature, allowing for optimized temperature control and operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of transistors is increased to achieve size reduction and higher speeds, then productivity and speed are improved, but device complexity increases making it difficult to guarantee operation across a wide temperature range
Solution Approach 1:
The integrated circuit device is divided into multiple functional blocks (first functional block, second functional block, third functional block), each with different guaranteed operation temperature ranges. This segmentation allows each block to be optimized for its specific temperature requirements, making the overall design more manageable despite increased transistor counts and complexity.
2Productivity
If the circuit size is reduced to increase integration density, then productivity is improved, but the guaranteed operation temperature range becomes more difficult to maintain
Solution Approach 1:
Different functional blocks are assigned different guaranteed operation temperature ranges based on their specific requirements. The first functional block guarantees operation from a first lower limit temperature to a first upper limit temperature, the second functional block from a second lower limit temperature to a second upper limit temperature, and so on. This local quality approach allows each block to be optimized for its specific temperature environment while maintaining high integration density.
Data Source
AI summary
Disclosed is an integrated circuit device comprising a startup operation circuit (101) for carrying out processing necessary for startup and a post-startup operation circuit (102) for carrying out a main operation after completion of the processing necessary for startup, wherein the post-startup operation circuit (102) has an operation guaranteed temperature whose lower limit is higher than a lower limit of an operation guaranteed temperature of the startup operation circuit (101), and the post-startup operation circuit (102) starts the main operation after a temperature of the integrated circuit device exceeds a threshold temperature which is equal to the lower limit of the operation guaranteed temperature of the post-startup operation circuit (102).