Integrated Circuit Startup and Post-Startup Circuits Temperature Threshold

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Solution Overview

Problem

The increasing number of transistors in integrated circuit devices due to size reduction and higher speeds makes it difficult to design for high-speed operation across a wide temperature range from lower to higher temperatures.

Innovation Solution

Incorporating a startup operation circuit and a post-startup operation circuit with different guaranteed temperature ranges, where the post-startup circuit starts the main operation only after the device's temperature exceeds a threshold temperature, allowing for reduced circuit size and enhanced design efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the number of transistors is increased to achieve size reduction and higher speeds, then productivity and speed are improved, but device complexity increases making it difficult to guarantee operation across a wide temperature range

Engineering Contradiction:

Improveoperation speedVSAvoidcircuit design complexity

Core Design Contradiction:

ProductivityVSDevice complexity

Solution Approach 1:

The integrated circuit device is divided into multiple functional blocks (first functional block, second functional block, third functional block), each with different guaranteed operation temperature ranges. This segmentation allows each block to be optimized for its specific temperature requirements, making the overall design more manageable despite increased transistor counts and complexity.

Inventive Principle:

Principle #1Segmentation

2Productivity

If the circuit size is reduced to increase integration density, then productivity is improved, but the guaranteed operation temperature range becomes more difficult to maintain

Engineering Contradiction:

Improveintegration densityVSAvoidoperation guarantee in temperature range

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

Different functional blocks are assigned different guaranteed operation temperature ranges based on their specific requirements. The first functional block guarantees operation from a first lower limit temperature to a first upper limit temperature, the second functional block from a second lower limit temperature to a second upper limit temperature, and so on. This local quality approach allows each block to be optimized for its specific temperature environment while maintaining high integration density.

Inventive Principle:

Principle #3Local quality

Data Source

PatentUS8089180B2Integrated circuit device, method of controlling operation of integrated circuit device, and method of fabricating integrated circuit device

Publication Date: 2012.01.03 PANASONIC HOLDINGS CORP

AI summary

Disclosed is an integrated circuit device comprising a startup operation circuit (101) for carrying out processing necessary for startup and a post-startup operation circuit (102) for carrying out a main operation after completion of the processing necessary for startup, wherein the post-startup operation circuit (102) has an operation guaranteed temperature whose lower limit is higher than a lower limit of an operation guaranteed temperature of the startup operation circuit (101), and the post-startup operation circuit (102) starts the main operation after a temperature of the integrated circuit device exceeds a threshold temperature which is equal to the lower limit of the operation guaranteed temperature of the post-startup operation circuit (102).