IC Attack Detection via Stray Capacitance Trenches

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Solution Overview

Problem

Integrated circuit chips are vulnerable to attacks such as fault injection and local etching, which existing detection solutions fail to reliably prevent or detect, leading to potential exposure of critical data.

Innovation Solution

The integration of parallel wells of alternated conductivity types with trenches filled with conductive material and a circuit that detects modifications in stray capacitance, preventing fault injection and detecting local etching attempts by modifying the chip's substrate.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If logic integrity tests are introduced into calculations to detect attacks, then detection capability is improved, but chip response times increase due to additional calculation steps

Engineering Contradiction:
Improveattack detection capabilityVSAvoidchip response time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent replaces logic-based integrity tests with a physical sensing mechanism. A sensor detects physical parameters (temperature, voltage, current) that change during laser attacks, enabling attack detection without additional calculation steps. This substitutes computational detection with direct physical measurement, resolving the contradiction between detection reliability and response time.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Reliability

If physical sensors sensitive to temperature or radiation are implemented to detect attacks, then detection capability is improved, but device complexity and silicon surface area increase

Engineering Contradiction:
Improveattack detection capabilityVSAvoidchip structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent makes existing chip components multi-functional by enabling them to serve both their primary function and attack detection. For example, existing temperature sensors or circuit elements are configured to detect both operational parameters and attack-induced anomalies. This eliminates the need for dedicated sensor structures, reducing device complexity while maintaining detection capability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Measurement precision

If the chip substrate is thinned to improve laser attack efficiency detection, then attack detection sensitivity is improved, but chip structural strength and protection are reduced

Engineering Contradiction:
Improvelaser attack detection sensitivityVSAvoidchip substrate strength
Core Design Contradiction:
Measurement precisionVSStrength

Solution Approach 1:

The patent implements protective measures before the chip undergoes thinning. Reinforcement structures or protective layers are integrated into the chip design prior to substrate thinning, ensuring that the weakened substrate maintains sufficient mechanical strength. This preliminary reinforcement allows the chip to be thinned for improved attack detection sensitivity while preventing structural failure.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution effectively prevents fault injection and detects local etching attempts, enhancing security without increasing the silicon surface area and addressing the limitations of existing solutions.

Implementation Method 1

a circuit capable of detecting a modification of the stray capacitance formed between said conductive material and a region of the chip

Methodology Applied
Scientific EffectStray capacitance: Capacitance

Implementation Method 2

preventing fault injection and detecting local etching attempts by modifying the chip's substrate

Methodology Applied
Scientific EffectLaser beam absorption: Absorption (EM radiation)

Data Source

PatentUS8946859B2Device for detecting an attack in an integrated circuit chip
Publication Date: 2015.02.03 STMICROELECTRONICS (ROUSSET) SAS
  • US8946859B2 patent drawing
  • US8946859B2 patent drawing
  • US8946859B2 patent drawing

AI summary

An integrated circuit chip including a plurality of parallel wells of alternated conductivity types formed in the upper portion of a semiconductor substrate of a first conductivity type, and a device of protection against attacks including: between the wells, trenches with insulated walls filled with a conductive material, said trenches extending from the upper surface of the wells to the substrate; and a circuit capable of detecting a modification of the stray capacitance formed between said conductive material and a region of the chip.