IC Package Substrate Layout for Warpage and Short Prevention
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Solution Overview
Problem
Integrated circuit (IC) packages face challenges in maintaining circuit reliability due to substrate thinning requirements, which can lead to warpage and increased risk of electron migration and electrical shorting.
Innovation Solution
A substrate design for IC packages that incorporates a core layer made of glass material for stabilization, along with an adjacent insulation layer and embedded metal structures positioned to avoid electron migration. The embedded metal structures are positioned at least a certain length from the core layer surface to prevent electrical shorting, and shorter vias are used to connect the metal structures through the core layer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of stationary object
If metal structures are positioned closer to the core layer to reduce package height, then package height is reduced, but electron migration risk increases leading to electrical shorts
Solution Approach 1:
An insulation layer is introduced as an intermediary between the metal structure and the core layer. This insulation layer physically separates the metal structure from the core layer, preventing electron migration while allowing the metal structure to be positioned closer to the core layer, thus reducing package height without compromising electrical safety
Solution Approach 2:
The substrate employs a composite structure combining the core layer, insulation layer, and metal structure in a multi-material configuration. This composite approach allows each material to fulfill its specific function while working together to achieve both compact dimensions and high reliability
2Length of stationary object
If core layer thickness is reduced to meet package height requirements, then package height is reduced, but warpage control becomes difficult
Solution Approach 1:
The thickness of the core layer is optimized to a specific range (5-20 micrometers) to balance package height reduction with warpage control. By precisely controlling the core layer thickness parameter and compensating through the insulation layer, the substrate achieves compact dimensions while maintaining dimensional stability and minimizing warpage
3Reliability
If insulation layer thickness is increased to prevent electron migration, then electrical short prevention is improved, but package height increases
Solution Approach 1:
The insulation layer thickness is optimized to a specific range (2-10 micrometers) that provides sufficient electrical isolation to prevent electron migration while minimizing the increase in package height. This parameter optimization ensures both reliability and compact dimensions are achieved simultaneously
Data Source
AI summary
A substrate includes a core layer and one or more metallization layers. The core layer provides stabilization to the substrate to reduce or avoid warpage. The core layer may include a glass material weaved throughout the core to provide stabilization and avoid warpage. A metallization layer adjacent to the core layer in the substate includes an insulation layer and the embedded metal structure(s) that is positioned from the core layer. The thickness of the insulation layer is greater than the embedded metal structure so that a surface of the embedded metal structure is positioned at least at a length from the surface of the glass material. This can avoid or reduce the risk of the embedded metal structure electrically shorting to another metal structure in the substrate through the core layer.


