Integrated Circuit Tamper Detection Using Frequency Shift Monitoring

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Solution Overview

Problem

Current methods for protecting integrated circuit (IC) intellectual property (IP) from tampering due to parametric variations, such as temperature and voltage changes, require significant resources and can alter device performance, necessitating a cost-effective and efficient anti-tampering strategy.

Innovation Solution

A system for detecting tampering in ICs using a reference signal insensitive to parametric variations and a signal sensitive to these variations, connected to a frequency performance circuit, with a compare circuit that asserts an output if the frequency performance exceeds a threshold, and a method for configuring a programmable logic device to measure and compare parametric shifts using parametric-stable and variant clock sources.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If fully sealed metal housing or epoxy coating is used for physical security, then IP protection is improved, but device performance is altered

Engineering Contradiction:
ImproveIP protectionVSAvoiddevice performance
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent replaces physical/mechanical security measures (sealed housing, epoxy coating) with an electronic monitoring system that uses temperature and voltage sensors coupled to logic circuits. This substitution allows IP protection through electronic detection of parametric shifts without the performance-altering constraints of physical enclosures.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Measurement precision

If elaborate temperature, voltage, and power sensors with dedicated monitoring circuitries are used, then detection effectiveness is improved, but resource requirements and complexity increase

Engineering Contradiction:
Improvedetection effectivenessVSAvoidresource requirements
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges the monitoring function with existing logic resources within the FPGAs themselves. Temperature and voltage sensors are coupled to logic circuits that utilize available logic resources to detect parametric shifts, eliminating the need for separate dedicated monitoring circuitries and reducing overall system complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The FPGAs monitor their own operating parameters (temperature and voltage) using sensors and logic circuits integrated within them. This self-monitoring capability eliminates the need for external monitoring systems and reduces resource requirements compared to elaborate separate monitoring setups.

Inventive Principle:
Principle #25Self-service

3Reliability

If elaborate monitoring methods are implemented, then IP protection effectiveness is improved, but implementation effort and cost increase

Engineering Contradiction:
ImproveIP protection effectivenessVSAvoidimplementation effort
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The FPGAs autonomously monitor their own operating conditions using integrated sensors and logic circuits, eliminating the need for complex external monitoring systems. This self-service approach reduces implementation effort and cost while maintaining effective IP protection.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces complex physical monitoring infrastructure with integrated electronic sensing and logic circuits within the FPGAs, significantly reducing implementation complexity and cost while maintaining detection effectiveness.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS7831873B1Method and apparatus for detecting sudden temperature/voltage changes in integrated circuits
Publication Date: 2010.11.09 XILINX INC
  • US7831873B1 patent drawing
  • US7831873B1 patent drawing
  • US7831873B1 patent drawing

AI summary

An integrated circuit is used to monitor and process parametric variations, such as temperature and voltage variations. An integrated circuit may include a temperature-sensitive oscillator circuit and a temperature-insensitive oscillator circuit, and frequency difference between the two sources may be monitored. In some embodiments, a parametric-insensitive reference oscillator is used as a reference to measure frequency performance of a second oscillator wherein the second oscillator performance is parametric-sensitive. The measured frequency performance is then compared to a tamper threshold and the result of the comparison is indicative of tampering.