IC Test Data Management System for Yield Analysis
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Solution Overview
Problem
The value of test data generated in IC tests is not effectively utilized due to the lack of efficient methods for managing and analyzing the large volumes of data produced during the testing process.
Innovation Solution
An information management method and system that collects and analyzes test data from IC tests, combining it with resource data to generate result data, which includes yield analysis, parameter analysis, and visualization tools for real-time monitoring and reporting, enabling the effective utilization of test data across different stages and purposes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If test data is collected and stored from IC tests, then the quantity of test data increases, but the ability to effectively utilize the data decreases
Solution Approach 1:
The patent segments test data into multiple categories including test result data, test condition data, device status data, and resource data. This segmentation allows for organized storage and targeted analysis of different data types, transforming the overwhelming volume of raw data into structured, usable information that can be effectively utilized for yield analysis, defect identification, and process optimization.
Solution Approach 2:
The patent merges test data with resource data (including wafer map data, process data, and device information) to create a comprehensive analysis framework. By combining multiple data sources that were previously stored separately, the system enables cross-referential analysis and transforms isolated data points into actionable insights for improving IC test effectiveness.
2Measurement precision
If comprehensive test data and resource data are analyzed together, then the quality of analysis results improves, but the complexity of the analysis system increases
Solution Approach 1:
The patent introduces an intermediary data processing layer that standardizes and pre-processes both test data and resource data before analysis. This intermediary layer includes data cleaning, format standardization, and feature extraction components that simplify the complexity of analyzing heterogeneous data sources while maintaining high analysis accuracy through systematic data preparation.
Solution Approach 2:
The patent creates a universal analysis platform that can handle multiple types of data (test results, conditions, device status, resources) through a single integrated system. This multi-functional platform uses standardized data interfaces and analysis algorithms that work across different data types, reducing overall system complexity while enabling comprehensive analysis through a unified approach.
3Ease of operation
If test data is converted to uniform format, then the ease of data processing improves, but the time required for data conversion increases
Solution Approach 1:
The patent implements preliminary data formatting actions by establishing standardized data templates and pre-processing protocols before actual test data generation. Test devices are configured with pre-defined data output formats, and resource data is pre-organized according to standardized schemas. This preliminary preparation eliminates the need for extensive conversion work after data collection, significantly reducing conversion time while maintaining processing ease.
Data Source
AI summary
The present invention discloses an information management method and system for IC tests, and a storage medium. The method comprises steps of: providing test data generated by performing an IC test by an IC test platform, the IC test platform being an IC test platform having more than one stage, each stage of the IC test platform comprising a plurality of test devices: providing resource data related to the IC test, other than the test data; and analyzing the IC test according to the test data of the IC test and the resource data, to obtain result data related to the IC test. In this way, the present invention can provide technical support for utilizing the value of test data generated in IC tests.