Integrated Circuit Test Unit Using Power Supply Network
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Solution Overview
Problem
Existing integrated circuit testing methods require complex resource-intensive connections and dedicated technology, making it difficult to test and install components across the circuit, and can lead to increased current consumption and safety issues in normal operating modes.
Innovation Solution
An integrated circuit design with test units comprising AND gates connected to internal outputs of components, allowing for efficient testing by injecting a test sequence and observing current variations at the power supply, enabling detection of defective components and deactivation of test units to prevent over-consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a scanline is used to connect all registers for testing, then the circuit can be tested by scanning registers sequentially, but the circuit complexity increases and dedicated connection technology is required
Solution Approach 1:
The patent extracts the testing function from the main circuit by using existing power supply connections and internal outputs. Instead of adding a separate scanline infrastructure, the test units leverage the power supply network to carry test signals and collect responses, thereby eliminating the need for dedicated testing connections while maintaining comprehensive testing capability.
Solution Approach 2:
The power supply network is given a dual function: it serves both as the power delivery system and as the test signal transmission medium. Test units use the same physical infrastructure (power supply lines, internal outputs) for both normal operation and testing, eliminating the need for separate testing hardware and reducing overall circuit complexity.
2Reliability
If a scanline is introduced to separate the circuit into two parts, then testing can be performed, but installing elementary components becomes more complex and certain connections are prevented
Solution Approach 1:
The patent removes the scanline boundary that was separating the circuit into two parts. By using the power supply network for testing, there is no need to partition the circuit, allowing elementary components to be installed and connected freely throughout the entire circuit without being constrained by a scanline boundary.
Solution Approach 2:
The power supply network serves as a universal medium that allows test signals to propagate through the entire circuit without requiring physical separation or dedicated pathways. This unified approach eliminates the need for boundary bridges or special connection means, simplifying the manufacturing process.
3Reliability
If test units with AND gates are used to test elementary components, then defective components can be detected by observing current variations, but current consumption increases during testing
Solution Approach 1:
The patent implements periodic testing by activating test units only during designated test phases and deactivating them during normal operation. Test units are selectively enabled based on the testing sequence, allowing comprehensive defect detection while minimizing current consumption during normal circuit operation. The test units can be activated and deactivated through control signals that manage their interaction with the power supply network.
Data Source
AI summary
An integrated circuit is provided, which includes at least one external input, a power supply and a plurality of elementary components, each having at least one internal input and at least one internal output. The circuit further includes at least one test unit having an AND gate, each input of which is connected to an internal output of one of the elementary components and an output of which is connected to the power supply via a resistor.