IC Test Socket With Mechanical Cam Actuation
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Solution Overview
Problem
Existing sockets for testing integrated circuits fail to securely hold and test miniaturized ICs under dynamic conditions, such as vibrations and thermal stimuli, while avoiding mechanical stress and ensuring precise electrical connections, especially as they are prone to structural deterioration and thermal fatigue.
Innovation Solution
A socket design featuring a sliding cavity with a movable member and a vertically movable electrical contact pad driven by linear mechanical movement, ensuring precise positioning and uniform force application, using mechanical actuators for both the contact pad and transfer member to maintain stable grip and electrical contact during testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Extent of automation
If pneumatic actuators internal to the socket are used for movement, then the socket can achieve automated operation, but the socket becomes subject to thermal fatigue in wide temperature ranges
Solution Approach 1:
The patent replaces pneumatic actuators with a mechanical actuation system consisting of a cam mechanism and lever arm. The cam, driven by a motor, converts rotational motion into linear motion to actuate the electrical contact pad and retaining wall, eliminating pneumatic components that are susceptible to thermal fatigue while maintaining automated operation
Solution Approach 2:
The patent changes the actuation mechanism from pneumatic to mechanical, fundamentally altering the system parameters. The mechanical system uses a cam profile designed to provide controlled movement at specific points in the cycle, replacing the continuous pneumatic pressure control with discrete mechanical position control
2Stability of the object's composition
If the socket uses strong grip to prevent loosening during vibrations, then stability under dynamic conditions is improved, but the integrated circuit may be mechanically overstressed
Solution Approach 1:
The patent employs dynamic actuation where the retaining wall and electrical contact pad are moved only during specific phases of the test cycle. The cam mechanism provides motion at precise moments: inserting the IC, establishing contact, and securing the retaining wall, then retracting when not needed. This dynamic approach provides strong grip when required while minimizing mechanical stress during other phases
Solution Approach 2:
The actuation system operates periodically through distinct phases: insertion phase where the IC is placed and contacts are made, testing phase where the IC is held stable, and removal phase where constraints are released. This periodic action ensures stable grip during vibrations only when necessary (during insertion and testing) while allowing relaxation during removal and waiting phases
3Productivity
If the socket is designed for high-cycle testing, then productivity is improved, but structural deterioration may occur
Solution Approach 1:
The patent replaces pneumatic actuators with a mechanical cam-and-lever system that eliminates seals and flexible components susceptible to degradation from thermal cycling and vibration. The solid mechanical components are more resistant to structural deterioration over high cycle counts while maintaining the required actuation functionality
Solution Approach 2:
The actuation system is segmented into distinct functional components: the cam mechanism for vertical actuation, the lever arm for motion transformation, and the retaining wall for horizontal securing. This segmentation allows each component to be optimized for its specific function and facilitates maintenance or replacement of individual parts without affecting the entire system
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The socket provides a stable, precise, and repeatable testing environment for miniaturized ICs under inertial and thermal stimuli, ensuring accurate results without mechanical overstress, and is adaptable for high-cycle testing with precise force control and uniform electrical contact.
Implementation Method 1
a movable electrical contact pad positioned below said flat lower wall at said test station and having a plurality of spring pins which are coincident and movable through said plurality of through holes to electrically contact said integrated circuit
Data Source
Figure 1
Figure 2A
Figure 2B
AI summary
A socket (1) for testing an integrated circuit (20), comprising a body (10) having a sliding cavity (11) having an insertion station (12) for the integrated circuit (20) and a test station (13) for the integrated circuit (20) delimited by a flat lower wall (14) having a plurality of through holes (41) at the test station (13) and a flat upper wall (15) parallel to the flat lower wall (14), a movable member (30) for transferring the integrated circuit (20) from the insertion station (12) and for retaining it in the test station (13), a movable electrical contact pad (40) positioned below the flat lower wall (14) at the test station (13) and having a plurality of spring pins (42) which are coincident and movable through the plurality of through holes (41) to electrically contact said integrated circuit (20) and lift it from a position of rest on said flat lower wall (14) to a blocked position contrasting against the flat upper wall (15), first movement means (100) for moving the movable electrical contact pad (40) and second movement means (200) for moving the transfer and retaining member (30), the first movement means (100) and the second movement means (200) being mechanical means for linear mechanical movement.