Automated IC Test System with Coordinated Loading and Unloading
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Solution Overview
Problem
Conventional IC device test systems rely heavily on operator intervention, leading to high error rates and inefficiencies in loading, testing, and sorting processes.
Innovation Solution
An automatic test system comprising interconnected loading-and-unloading equipment and test equipment that communicate to automate the loading, testing, unloading, and sorting of IC devices, using computers and transceivers for communication and robotic arms for handling, allowing for real-time status monitoring and coordinated operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If operator manually loads and unloads target devices on test carriers, then device handling can be performed, but operation efficiency is low and error rate is high
Solution Approach 1:
The loading-and-unloading equipment automatically performs device loading, unloading, and sorting operations without operator intervention. The system self-manages the entire workflow by receiving test results, determining device status, and categorizing devices into appropriate storage areas based on test outcomes.
Solution Approach 2:
Manual mechanical operations by operators are replaced with automated loading-and-unloading equipment comprising mechanical arms, conveyors, and robotic handling systems. This substitution eliminates human error and increases operational precision and speed.
2Productivity
If loading-and-unloading equipment and test equipment operate independently, then each equipment can function autonomously, but overall test efficiency drops due to lack of coordination
Solution Approach 1:
The loading-and-unloading equipment and test equipment are merged into a unified automated test system through communication interfaces. The loading-and-unloading computer receives test results from the test computer and coordinates device handling operations, creating an integrated workflow that improves overall efficiency.
Solution Approach 2:
The system implements feedback loops where test equipment provides test results to the loading-and-unloading equipment, which then adjusts its operations accordingly. This feedback mechanism enables real-time coordination and ensures that device handling is synchronized with test progress.
Data Source
AI summary
In an automatic test system, a test computer of a kind of test equipment communicates with a loading-and-unloading computer of a kind of loading-and-unloading equipment. The loading-and-unloading equipment automatically loads a plurality of target devices on a plurality of test carriers according to the state of the test equipment, and the test equipment automatically tests the target devices loaded on the test carriers according to the state of the loading-and-unloading equipment. In addition, after the test is completed, the loading-and-unloading equipment automatically unloads the tested target devices from the test carriers, and automatically sorts the tested target devices according to the test results generated by the test equipment.