Integrated Circuit Testing System with Reference Device Segmentation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current testing systems for integrated circuit devices primarily focus on functional testing and may not detect behavioral failures, which occur when the devices are operated within their intended application environment, necessitating additional application-specific testing to ensure proper system behavior.
Innovation Solution
A testing system comprising a processor that performs application tasks, a controller to tap and transmit test data to both a reference and under-test integrated circuit devices, and a comparator to compare response data, allowing for comprehensive testing across different test modes to simulate real-world application environments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If functional testing is performed to verify device functions and manufacturer specifications, then manufacturing precision is improved, but behavioral failures in application environments cannot be detected
Solution Approach 1:
The testing system segments the testing process into two distinct modes: functional testing mode (using a functional test processor) and application-specific testing mode (using an application processor). This segmentation allows each testing mode to focus on its specific objectives without interfering with the other, enabling both functional verification and behavioral failure detection to be performed systematically.
Solution Approach 2:
The testing system achieves multi-functionality by incorporating both a functional test processor and an application processor within the same system architecture. The controller can selectively activate either processor based on the testing requirements, making the system universal enough to handle both functional testing and application-specific testing scenarios.
2Reliability
If application-specific testing is added to detect behavioral failures, then reliability is improved, but device complexity increases
Solution Approach 1:
The system merges the functional test processor and application processor into a unified testing architecture, where both processors can share common infrastructure such as the controller, device under test interface, and result analysis mechanisms. This merging reduces overall system complexity compared to having completely separate testing systems.
Solution Approach 2:
The controller serves as an intermediary that manages the interaction between the functional test processor, application processor, and device under test. It coordinates test execution, data collection, and result analysis, simplifying the complexity by providing a centralized control mechanism rather than requiring direct complex interactions between all system components.
3Reliability
If both functional testing and application-specific testing are performed, then comprehensive testing coverage is improved, but testing time increases
Solution Approach 1:
The testing system implements dynamic test mode selection, where the controller can adaptively choose between functional testing, application-specific testing, or both modes based on real-time requirements. This dynamic approach allows for optimized testing sequences and enables the system to adjust testing depth and scope to minimize overall testing time while maintaining comprehensive coverage.
Data Source
AI summary
Embodiments described herein relate to systems and methods for testing integrated circuit devices within an environment that is representative of the application environment in which an integrated circuit device will be used. In at least one embodiment, the testing system comprises a second reference integrated circuit device that provides flexibility in testing, allowing only the input to a first reference integrated circuit device of an application system to be tapped and not necessarily both input to and output from the first reference integrated circuit device to be tapped. In some embodiments, the input to the first reference integrated circuit device may be subsequently modified by a controller. The controller is configured to tap first test data transmitted to the first reference integrated circuit device of the application system, and transmit second test data to both the second reference integrated circuit device and at least one integrated circuit device under test, the second test data comprising at least a portion of the first test data. Reference response data received from the second reference integrated circuit device may then be compared with output from the at least one integrated circuit device under test.