Integrated Circuit TID Exposure Deactivation
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Solution Overview
Problem
Integrated circuits designed for non-satellite uses face export restrictions due to radiation hardness, requiring costly testing and licensing, as they may inadvertently meet satellite operation criteria for total ionizing dose (TID) exposure.
Innovation Solution
Incorporating a sensing circuit with transistors and a controller that biases sensing transistors to detect TID exposure and selectively disable user circuitry when thresholds are met, ensuring compliance with regulations like ITAR by rendering the IC non-functional.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a semiconductor device is designed with improved performance and scaling for non-satellite applications, then operational capabilities exceed minimum requirements, but the device may inadvertently meet satellite operation criteria and become subject to ITAR export restrictions
Solution Approach 1:
The patent applies preliminary action by implementing a TID sensing circuit and controller that proactively monitor radiation exposure levels before the device reaches critical thresholds. The controller continuously compares sensed TID levels against predetermined thresholds and preemptively disables the output stage when thresholds are approached, preventing the device from inadvertently meeting satellite operation criteria and avoiding ITAR restrictions before they become an issue
Solution Approach 2:
The patent uses an intermediary approach by introducing a TID sensing circuit and controller as a mediator between the radiation environment and the semiconductor device. This intermediary system senses TID exposure levels, processes the information, and controls the device's operational state accordingly, allowing the device to maintain optimal performance for non-satellite applications while automatically adapting its behavior in response to radiation conditions
2Object-affected harmful factors
If a device is designed to operate in high radiation environments, then it can withstand TID exposure, but it becomes subject to usage regulations and requires costly product testing and sorting to verify unsuitability for satellite operation
Solution Approach 1:
The patent applies self-service by enabling the semiconductor device to automatically monitor its own TID exposure levels through an integrated sensing circuit and controller. The device self-diagnoses radiation damage by sensing changes in transistor parameters and automatically disables itself when TID thresholds are reached, eliminating the need for external costly testing and licensing to verify unsuitability for satellite operation
Solution Approach 2:
The patent uses parameter changes by monitoring shifts in transistor electrical parameters (such as threshold voltage and leakage current) that occur due to TID exposure. The sensing circuit detects these parameter changes and the controller uses them to determine when to disable the device, providing a cost-effective alternative to traditional radiation hardness testing methods
3Reliability
If a TID sensing circuit is integrated into the semiconductor device, then automatic deactivation can be achieved, but device complexity increases with additional sensing transistors, controllers, and deactivation circuitry
Solution Approach 1:
The patent applies universality by designing the TID sensing circuit to serve multiple functions: it senses TID exposure levels, compares them against thresholds, controls device deactivation, and can potentially indicate the level of radiation damage. This multi-functionality reduces the need for separate dedicated circuits for each function, thereby minimizing the increase in device complexity while maintaining reliable automatic TID protection
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the detection of TID exposure and subsequent disablement of user circuitry, preventing ICs from meeting satellite operation criteria, thus avoiding export restrictions and costly testing, while ensuring safe shutdown and extended IC lifetime through redundant circuitry.
Implementation Method 1
total ionizing dose (TID) which is characterized in terms of cumulative absorbed dose as a measure of deposited ionizing radiation energy per unit mass, such as joules per kilogram or rads
Implementation Method 2
semiconductor devices not intended for satellite uses are rendered nonfunctional when subjected to specified amounts of total ionizing dose (TID)
Data Source
AI summary
Integrated circuits and methods for deactivating user circuit operation with one or more wide channel sensing transistors biased to an on condition for exposure to total ionizing dose and then to an off condition for measurement and comparison of a leakage current or threshold voltage parameter to a predetermined reference, and a deactivation circuit selectively disables operation of the user circuit if the sensed parameter is greater than or equal to the reference.