IC Timing Characterization Using Region-Specific Data
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Solution Overview
Problem
Conventional timing characterization methods for integrated circuit devices are overly pessimistic due to manufacturing variations, leading to unduly de-rated devices that do not accurately reflect their speed, as they fail to account for systematic and random variations in resource delays across different regions of the dice.
Innovation Solution
A method involving the application of test data to multiple dice with different element types, analysis of output data to generate characterization data that accounts for both systematic and random variations, and the use of this data to optimize circuit placement within regions of the dice, allowing for more accurate timing specifications and improved performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional timing characterization methods use the slowest elements to characterize devices, then timing yield is ensured, but the characterization becomes unduly pessimistic and does not accurately reflect device speed
Solution Approach 1:
The patent divides the device into multiple regions and creates separate timing characterization data for each region based on local performance characteristics. Instead of using a single pessimistic value for the entire device, the method characterizes each region's actual performance and uses region-specific timing data, allowing faster regions to be accurately reflected while still ensuring timing yield through proper placement constraints.
Solution Approach 2:
The patent segments the device into multiple regions with different performance characteristics and generates separate characterization data for each segment. This segmentation allows the timing analysis to account for spatial variations in performance without being overly pessimistic about the entire device, thereby improving measurement precision while maintaining reliability.
2Reliability
If de-rating is applied to account for manufacturing variations, then timing specifications become conservative, but device performance is underestimated
Solution Approach 1:
The patent applies local quality by creating region-specific timing specifications that reflect actual local performance rather than applying a uniform de-rating across the entire device. This allows the device to operate at higher performance levels in regions where the manufacturing variations permit, while still maintaining conservative specifications in regions where variations require it, thereby improving overall productivity without sacrificing reliability.
3Reliability
If timing data for slowest elements is used to characterize devices, then all dice meet specifications, but faster dice are not accurately represented
Solution Approach 1:
The patent implements local quality by measuring and characterizing timing performance in different regions separately, then using region-specific data that accurately represents the actual performance of elements in each region. This approach ensures that faster regions are accurately represented with their true performance characteristics while still maintaining specification compliance through proper placement and timing constraints.
Solution Approach 2:
The patent segments the device into multiple regions and generates separate characterization data for each segment. This segmentation enables the timing characterization to accurately represent faster regions without being constrained by the slowest elements, thereby improving measurement precision while maintaining specification compliance through region-aware design tools.
4Productivity
If region-based characterization data is used, then circuits can be optimally placed in faster regions, but the device complexity increases
Solution Approach 1:
The patent segments the device into multiple regions and generates separate characterization data for each segment. This segmentation enables optimization of circuit placement by allowing design tools to select regions based on performance requirements, improving productivity while the segmentation itself provides a manageable structure for the increased complexity.
Solution Approach 2:
The patent changes the parameters of the characterization data by introducing region-specific timing values instead of using single global values. This parameter change enables more accurate and optimized circuit placement while the structured approach to parameter organization helps manage the increased data complexity through systematic variation awareness.
Data Source
AI summary
Methods of enabling functions of a design to be implemented in an integrated circuit device are disclosed. An exemplary method comprises applying test data to a plurality of dice having different element types for implementing circuits, wherein the plurality of dice have a common layout of the different element types for implementing the circuits; receiving output data from the plurality of dice in response to applying the test data to the plurality of dice; analyzing the output data from the plurality of dice; transforming by a computer the output data to characterization data comprising timing data associated with the different element types for implementing circuits, wherein the characterization data comprises data associated with regions of the dice, and storing the characterization data. A computer program product for enabling functions of a design to be implemented in an integrated circuit device is also disclosed.