IC Voltage Regulation via Stored Characteristic Values
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Solution Overview
Problem
Semiconductor device production yield is affected by process variations, leading to IC chips being considered defective due to non-uniform processing, resulting in scrapage of chips that do not meet performance requirements across a general input voltage range.
Innovation Solution
An integrated circuit (IC) with a memory element storing specific values based on characteristics like speed and power consumption, and a controller generating control signals to regulate the input voltage, ensuring the IC operates within optimal performance parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a general input voltage range is applied to all IC chips, then manufacturing simplicity is maintained, but yield is reduced due to process variations causing some chips to fall outside performance specifications
Solution Approach 1:
The patent applies preliminary action by determining and storing specific voltage range values (minimum and maximum voltages) for each individual IC chip during the manufacturing process before the chips are deployed. This pre-characterization allows the chips to be used with optimized voltage ranges that match their specific performance characteristics, thereby improving yield without requiring complex real-time control systems during operation.
Solution Approach 2:
The patent implements parameter changes by allowing different input voltage ranges for different IC chips based on their individual performance characteristics. Instead of using a single general voltage range for all chips, the system stores and applies chip-specific minimum and maximum voltage values that are determined during manufacturing. This customization of voltage parameters enables chips that would otherwise be scrapped due to process variations to be used effectively.
2Productivity
If individual voltage ranges are determined for each IC chip based on performance characteristics, then yield is improved, but manufacturing complexity increases due to additional testing and data storage requirements
Solution Approach 1:
The patent applies the copying principle by storing the determined voltage range parameters (minimum and maximum voltages) in non-volatile memory elements on each IC chip. This creates a permanent copy of the chip's electrical characteristics that can be read during operation to configure the appropriate voltage range. This approach avoids the need for complex real-time measurement and adjustment systems, simplifying both manufacturing and operation while maintaining high yield.
3Productivity
If chips operating outside general voltage specifications are scrapped, then performance reliability is maintained, but yield is reduced due to process-induced variations
Solution Approach 1:
The patent implements local quality by tailoring the input voltage range to match the specific performance characteristics of each individual IC chip. Instead of applying a uniform voltage specification to all chips, the system determines and applies customized voltage ranges (specific minimum and maximum values) for each chip based on its actual performance. This localized approach ensures that each chip operates within its optimal voltage range, maintaining reliability while improving yield.
Data Source
AI summary
Aspects of the disclosure provide an integrated circuit (IC) that is configured to have an increased yield. The IC includes a memory element configured to store a specific value determined based on a characteristic of the IC, and a controller configured to control an input regulator based on the specific value of the IC. The input regulator is operative to provide a regulated input to the IC during operation, such that the IC performance satisfies performance requirement.