Integrated Circuit Testing Voltage Measurement Segmentation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing integrated circuit testing methods face measurement errors due to voltage drops caused by load currents flowing through probes, leading to inaccurate output voltage measurements, especially when larger load currents are drawn.
Innovation Solution
The use of a selection switch, such as a multiplexer, to output either of two output voltages from separate power units to a voltage pin, allowing for serial measurement and storage of these voltages without the influence of voltage drops, using either resistive or electronic loads, and a processor to generate and control the selection and measurement signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If load current is drawn from the power integrated circuit for testing, then the output voltage can be tested under load conditions, but voltage drops occur due to current flowing through probes causing measurement errors
Solution Approach 1:
The patent divides the testing function into separate segments: one path for applying load current through dedicated load pins, and another path for measuring output voltage through separate voltage pins. This segmentation prevents the measurement probe from carrying load current, eliminating voltage drops during measurement while maintaining the ability to test under load conditions.
Solution Approach 2:
The patent introduces separate voltage pins as intermediary measurement points that do not carry load current. These voltage pins serve as mediators between the power output and the measurement instrument, allowing voltage measurement without the harmful effect of current flow through the measurement path.
2Measurement precision
If separate pins are used for voltage measurement and current loading, then measurement accuracy improves, but device complexity increases
Solution Approach 1:
The patent makes the integrated circuit package multi-functional by incorporating both load pins and voltage pins within the same package. The load pins handle current delivery while voltage pins handle measurement, allowing the single device to perform both functions simultaneously without requiring separate testing equipment.
Solution Approach 2:
The patent combines the voltage measurement function and current loading function into a single integrated circuit package. By merging both functionalities with their respective dedicated pins in one package, the overall system complexity is reduced compared to using separate devices for voltage measurement and current loading.
Data Source
Figure 1
Figure 2
Figure 3
AI summary
An integrated circuit includes a first power unit, a second power unit, and a selection switch. The first power unit generates a first output voltage and is coupled to a first load pin. The first load pin is coupled to a first load. The second power unit generates a second output voltage and is coupled to a second load pin. The second load pin is coupled to a second load. The selection switch outputs either the first output voltage or the second output voltage to a voltage pin according to a selection signal.