Simulation Method for Integrated Circuit Yield Prediction
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Solution Overview
Problem
Conventional methods for detecting design defects in integrated circuit chips are time-consuming, leading to wasted production and test costs, and prolonging the design update cycle.
Innovation Solution
A simulation method that acquires redundancy design configuration data and historical test data, allocates repair schemes to failure cells using a preset repair algorithm, and calculates the yield of products based on the simulation repair results, allowing for early defect detection and design improvement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If testers detect design defects through test and verification on semiconductor products, then design defects can be detected, but it is time-consuming and causes waste of production and test costs
Solution Approach 1:
The patent applies preliminary action by performing simulation tests on design data before actual semiconductor product manufacturing. The simulation system executes test patterns on pre-silicon models to predict yield and detect design defects early in the design phase, avoiding the need for time-consuming post-manufacturing testing while maintaining defect detection capability.
2Reliability
If testers detect design defects through test and verification on semiconductor products, then design defects can be detected, but production and test costs are wasted
Solution Approach 1:
The simulation system performs defect detection before semiconductor manufacturing, allowing design defects to be identified and corrected in the design phase when changes are inexpensive. This preliminary detection eliminates waste of production and test costs by preventing defective designs from proceeding to costly manufacturing and testing stages.
Solution Approach 2:
The patent uses simulation models and pre-silicon copies of the semiconductor design to perform virtual testing. Instead of testing actual manufactured chips, the system creates and tests digital replicas, eliminating the need for physical production and testing while maintaining defect detection capability.
3Reliability
If testers detect design defects through test and verification on semiconductor products, then design defects can be detected, but the design update cycle is prolonged
Solution Approach 1:
By performing defect detection through simulation before manufacturing, the system enables early identification of design issues that can be immediately corrected. This eliminates the lengthy iteration cycle between manufacturing, testing, and redesign, significantly accelerating the design update cycle while maintaining comprehensive defect detection.
Data Source
AI summary
The present application relates to a simulation method and apparatus, a computer device and a storage medium. The method includes: acquiring RDC data and historical test data of products, the RDC data including repair schemes; allocating the repair schemes to failure cells in the historical test data according to a preset RA, and acquiring a corresponding simulation repair result; and obtaining a yield of the products based on the simulation repair result and the historical test data.