ICT Fixture Probe Cleaning Plate with Air Seal Gasket
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Solution Overview
Problem
Traditional bed of nails ICT fixtures require manual and time-consuming cleaning of probes, which can lead to contamination, faulty contacts, and increased test time due to flux residues, posing a challenge in maintaining reliable probe contact and device under test yield.
Innovation Solution
A cleaning device with a substrate and air seal gasket is designed to support ICT fixture probes, directing air through holes to prevent cleaning solution seepage and maintain structural integrity, allowing for efficient cleaning of probe heads while minimizing damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If manual cleaning method is used to clean probe heads, then cleaning can be performed, but the process is time-consuming and probes are vulnerable to damage
Solution Approach 1:
The patent replaces manual mechanical cleaning operations with an automated air blow system. Compressed air is directed through holes in the support plate to blow cleaning solution off probe heads, eliminating the need for manual scrubbing and significantly reducing cleaning time while preventing probe damage.
Solution Approach 2:
The cleaning system uses the probe heads themselves as part of the cleaning mechanism. The air blow system directs cleaning solution onto the probe heads, and the same air flow then blows the solution off, allowing the probes to be cleaned by the cleaning process rather than requiring separate manual intervention.
2Ease of operation
If top plate is removed to access probes for cleaning, then probe cleaning is possible, but probes lack structural support and are prone to bending
Solution Approach 1:
The patent introduces a support plate as an intermediary component between the probe heads and the top plate. This support plate provides structural support to the probe heads during cleaning operations, preventing bending and damage, while still allowing access to the probe heads for cleaning. The support plate acts as a mediator that maintains probe integrity without blocking cleaning access.
3Reliability
If cleaning solution is applied to probe heads, then cleaning effectiveness is achieved, but solution can seep into probe bases causing contamination
Solution Approach 1:
The support plate is designed with multiple discrete holes that are strategically positioned and sized. This segmentation allows cleaning solution to be applied to probe heads while the holes provide controlled pathways that prevent excessive solution from reaching the probe bases. The segmented structure of the support plate with its specific hole pattern creates zones that manage fluid flow and prevent contamination.
Solution Approach 2:
The support plate provides different functions at different locations: it offers structural support where probes are inserted, allows controlled fluid passage through strategically positioned holes, and prevents solution seepage in critical areas. The local properties of the support plate (hole size, position, and distribution) are optimized to balance cleaning effectiveness with contamination prevention.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The cleaning device enhances cleaning efficiency, reduces damage to probes, and minimizes contamination, thereby improving test reliability and reducing test cycle times by supporting probes during the cleaning process and controlling the flow of cleaning solutions.
Implementation Method 1
air is directed into the hollow section via the one or more air input through holes air is directed out of the hollow section via the plurality of through holes... the air forced through the plurality of first through holes forces cleaning solvent applied to the probe heads away from the plurality of first through holes
Data Source
AI summary
A probe cleaning plate is configured to clean the probe plate of an ICT fixture. In particular, the probe cleaning plate is used to support a plurality of probes included as part of the probe plate and enable cleaning of the probe heads of each probe while maintaining support of the probes and minimizing, if not preventing, seepage of cleaning solution and contaminates from to the base of the probes.