Ideal Diode Integrity Testing via Switching Circuits
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Solution Overview
Problem
Existing systems for testing ideal diodes used in redundant voltage buses lack effective methods to determine the operating status of these diodes, which is crucial for ensuring proper function and detecting potential failures, especially in sensitive electronics like those on aircraft.
Innovation Solution
A method and system that utilize switching circuits controlled by test controllers to assess the status of ideal diodes by switching between open and closed states, measuring voltage signals, and generating fault signals to identify operational issues in the diodes and their controllers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of energy
If ideal diodes are used instead of standard diodes to reduce power loss, then power efficiency is improved, but the ability to detect component failures deteriorates due to lack of inherent testing mechanisms
Solution Approach 1:
The patent applies preliminary action by implementing a test controller that proactively tests ideal diodes before failures occur. The system includes test controllers coupled to ideal diodes in a redundant voltage bus that continuously monitor and test diode functionality, detecting open circuit failures, short circuit failures, and controller failures before they affect system operation. This preventive testing approach ensures reliable operation while maintaining the power efficiency benefits of ideal diodes.
2Reliability
If switching circuits are added to test ideal diodes, then fault detection capability is improved, but system complexity increases
Solution Approach 1:
The patent applies universality by designing test controllers that perform multiple functions: they control ideal diodes during normal operation and simultaneously test them for failures. The test controllers are coupled to receive voltage from the redundant voltage bus and can detect various failure modes (open circuit, short circuit, controller failures) using the same hardware infrastructure. This multi-functional approach improves fault detection without proportionally increasing system complexity.
Solution Approach 2:
The patent uses an intermediary approach by introducing test controllers as mediator components between the ideal diodes and the system monitor. These test controllers facilitate failure detection by intermediating the testing process - they apply test signals, measure responses, and report status without requiring direct complex interactions between all system components. This intermediary layer simplifies the overall system architecture while enabling comprehensive fault detection.
Data Source
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AI summary
A power system includes a first power input 102, a second power input 150, a power output 184, a first ideal diode 115 coupled to the a power input and a power output and a second ideal diode 165 coupled to a second power input and the power output. The power system also includes a first switching circuit 109 coupled to the first power input and the first ideal diode and a second switching circuit 159 coupled to the second power input and the second ideal diode, the switching circuits operating as an open or a short circuit based on an input. The power system also includes a test controller 190 coupled to the first switching circuit, the second switching circuit and the power output and configured to determine an operating status of the power system based on an input to the first switch, inputs to the second switch and the power output.