IED Parameter Recording with Segmented Resolution
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Solution Overview
Problem
Intelligent electronic devices (IEDs) used in industrial and utility systems face challenges in predicting failures due to unforeseen problems and difficulties in logging real-world usage data, leading to potential equipment hazards and costly downtime.
Innovation Solution
A system that records and stores operating parameters of IEDs over long periods, using a record module to obtain and store data at varying resolutions, allowing for advanced prediction of failures by identifying trends in deterioration and maintaining data in memory to reduce the likelihood of loss.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If operating parameters are recorded continuously at high resolution, then measurement precision is improved, but loss of information increases due to memory constraints
Solution Approach 1:
The patent segments the recording period into multiple intervals with different resolutions. Recent data is recorded at high resolution while historical data is recorded at lower resolution, allowing long-term storage without losing all detail. This is achieved by dividing the memory into multiple storage areas corresponding to different time intervals and resolution levels.
Solution Approach 2:
Different parts of the stored data have different qualities (resolutions). The patent applies varying resolution levels to different time periods or data types, with more recent or critical data stored at higher resolution and older or less critical data at lower resolution, optimizing both memory usage and diagnostic value.
2Reliability
If data is stored for long periods, then reliability of failure prediction is improved, but loss of information increases due to memory constraints
Solution Approach 1:
The patent enables extended storage by segmenting data into different resolution levels across time intervals. This allows historical data to be retained for long periods at reduced resolution, providing sufficient information for failure pattern recognition while preventing memory overflow that would cause data loss.
3Loss of information
If memory capacity is increased to store more data, then loss of information is reduced, but device complexity increases
Solution Approach 1:
The patent implements dynamic resolution adjustment based on available memory capacity and data age. The system automatically adapts the recording resolution to current conditions, switching between high and low resolution modes as needed, which reduces memory management complexity compared to static high-resolution storage.
Solution Approach 2:
The patent changes the resolution parameter of stored data based on time interval and memory availability. By dynamically adjusting this key parameter, the system optimizes memory utilization and reduces the complexity of managing fixed-capacity memory while maintaining sufficient diagnostic information.
Data Source
AI summary
The present disclosure provides systems and methods for recording operating parameters of an intelligent electronic device (IED). A system may include a parameter acquisition module, a parameter storage module, and a memory management module. The parameter acquisition module may be configured to periodically obtain operating parameters of an IED at a first interval. The first interval may have a first time length to provide a first resolution of operation of the IED. The parameter storage module may be configured to store the operating parameters. The memory management module may be configured to delete, outside a first resolution period, a first portion of the operating parameters while maintaining a second portion of the operating parameters. The second portion may include operating parameters for each of a second interval. The second interval may have a second time length to provide a reduced second resolution of the operation of the IED.