IGBT Gate Resistor Timing to Reduce Tail Current

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Solution Overview

Problem

Existing IGBTs face challenges in achieving fast-switching operations due to tail current flow caused by residual carriers, and existing solutions like introducing crystal defects increase leakage current.

Innovation Solution

A semiconductor device with a drive circuit that includes resistors of different resistance values connected to IGBT cells, allowing for controlled timing of gate signal transitions to reduce residual hole carrier density.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If the IGBT structure and control circuit are significantly changed to reduce tail current, then switching speed is improved, but device complexity increases

Engineering Contradiction:
Improveswitching speedVSAvoiddevice complexity
Core Design Contradiction:
SpeedVSDevice complexity

Solution Approach 1:

The IGBT is divided into multiple cell groups, each with independent gate control. This segmentation allows different turn-off timings for different cell groups, reducing tail current and improving switching speed while maintaining a relatively simple overall device structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The first gate is turned off before the second gate in a preliminary action sequence. This preliminary turn-off of the first gate reduces the hole carrier density before the second gate turns off, thereby reducing tail current and enabling faster switching without complex circuit modifications.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables faster switching by reducing tail current and promoting carrier recombination, improving switching speed without increasing leakage current.

Implementation Method 1

a first resistor comprising a first electrode electrically connected to the gate control circuit and a second electrode; and a second resistor comprising a first electrode electrically connected to the gate control circuit and a second electrode that is not electrically connected to the second electrode of the first resistor; wherein the second resistor comprises a resistance value greater than that of the first resistor

Methodology Applied
Scientific EffectResistor: Electrical Resistance

Implementation Method 2

IGBTs (Insulated Gate Bipolar Transistor) are capable of low ON voltage by the effect of conductivity modulation

Methodology Applied
Scientific EffectConductivity modulation:

Implementation Method 3

it has been known to introduce a crystal defect in a drift region and capture a residual carrier by the carrier trap effect

Methodology Applied
Scientific EffectCarrier trap effect:

Data Source

PatentUS12362744B2Semiconductor device
Publication Date: 2025.07.15 SANKEN ELECTRIC CO LTD
  • US12362744B2 patent drawing
  • US12362744B2 patent drawing
  • US12362744B2 patent drawing

AI summary

A semiconductor device according to one or more embodiments may include a drive circuit comprising: a gate control circuit that generates a gate control signal; a first resistor comprising a first electrode electrically connected to the gate control circuit and a second electrode; and a second resistor comprising a first electrode electrically connected to the gate control circuit and a second electrode that is not electrically connected to the second electrode of the first resistor; wherein the second resistor comprises a resistance value greater than that of the first resistor; an IGBT circuit comprising: a first IGBT cell electrically connected to the second electrode of the first resistor; and a second IGBT cell electrically connected to the second electrode of the second resistor.