III-Nitride Porosity Control via Conductivity Selective Etching

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Solution Overview

Problem

There is a need for III-nitrides with spatially controlled porosities and physical properties to overcome the performance limitations of existing semiconductor materials, particularly in achieving optimized electrical, thermal, and optical properties for advanced electronic and photonic devices.

Innovation Solution

The method involves combining conductivity selective electrochemical etching with ion implants to create III-nitrides with controlled porosity, allowing for the reduction of electrical conductivity in specific regions and the formation of porous structures with tunable porosity and morphology, enabling the optimization of local properties without exposing the material to ultraviolet illumination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If electrochemical etching is applied to doped III-nitride regions, then porosity is formed in those regions, but electrical conductivity is reduced which prevents further porosification control

Engineering Contradiction:
Improvespatial control of porosityVSAvoidelectrical conductivity
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

The patent applies local quality by creating distinct regions with different properties within the III-nitride layer. Ion implantation is used to create a first region with modified properties (reduced electrical conductivity) while leaving a second region unchanged (maintaining high electrical conductivity). This allows selective electrochemical etching to occur only in the second region, achieving spatially controlled porosity while preserving electrical conductivity in other areas.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If ion implantation is used to reduce electrical conductivity in selected regions, then porosity can be controlled, but the process complexity increases

Engineering Contradiction:
Improveporosity controlVSAvoidfabrication process
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies preliminary action by performing ion implantation before the electrochemical etching step. The ion implantation modifies the electrical conductivity of specific regions in advance, creating a conductivity map that guides subsequent selective etching. This preliminary modification allows the etching process to automatically follow the desired porosity pattern without requiring complex real-time control mechanisms.

Inventive Principle:
Principle #10Preliminary action

3Manufacturing precision

If conventional etching methods are used on III-nitride, then material removal is achieved, but precise spatial control of porosity is not obtained

Engineering Contradiction:
Improveporosity distributionVSAvoidetching process
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent introduces an intermediary mechanism - electrical conductivity - that mediates between the etching process and the desired porosity pattern. By using ion implantation to create conductivity variations, the system translates a simple conductivity-based selection criterion into complex spatial porosity control. The electrochemical etching process naturally follows the conductivity gradients created by ion implantation, achieving precise porosity distribution without complex masking or lithography steps.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for precise control of porosity and electrical, thermal, and optical properties, enhancing the performance of III-nitride-based devices by maintaining high electrical conductivity in non-implanted regions and achieving significant porosity in implanted areas, suitable for applications in VCSELs and other optoelectronic devices.

Implementation Method 1

Selective and controlled porosification of doped III-nitride regions or domains rely on introduction of one or more ion implants into pre-defined and selected regions or domains of doped layer(s) of bulk III-nitride allowing for a reduction in the electrical conductivity of the ion implanted regions or domains

Methodology Applied
Scientific EffectIon implantation: Ion Implantation

Implementation Method 2

The porosification of the doped regions or domains of the III-nitrides produces porosities within these regions or domains in the range of between about 1% and 90% or 20% and 80%

Methodology Applied
Scientific EffectElectrochemical etching: Electrolysis

Data Source

PatentUS20230052931A1Control and localization of porosity in iii-nitrides and methods of using and making thereof
Publication Date: 2023.02.16 YALE UNIVERSITY
  • US20230052931A1 patent drawing
  • US20230052931A1 patent drawing
  • US20230052931A1 patent drawing

AI summary

III-Nitride layers having spatially controlled regions or domains of porosities therein with tunable optical, electrical, and thermal properties are described herein. Also disclosed are methods for preparing and using such III-nitride layers.