III-V Transistor-Varactor Integration for Simpler Chip Fabrication

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Solution Overview

Problem

Existing electronic devices face challenges in simplifying manufacturing processes, reducing costs, and minimizing dimensions while maintaining high quality standards.

Innovation Solution

The electronic device incorporates a substrate with a III-V semiconductor material-based transistor and variable capacitor, both fabricated using an epitaxy process with lithography etching, allowing for integration on the same substrate and shared metal electrodes to reduce component count and space requirements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If traditional separate fabrication processes are used for transistors and capacitors, then manufacturing precision can be maintained, but manufacturing complexity and costs increase

Engineering Contradiction:
Improvemanufacturing process simplicityVSAvoidcomponent integration complexity
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The patent merges the fabrication processes for transistors and capacitors into a single integrated process. Both components are formed simultaneously on the same substrate using the same epitaxial growth and lithography etching steps, eliminating the need for separate fabrication lines and reducing manufacturing complexity while maintaining precision.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent employs universal fabrication steps that serve multiple purposes. The epitaxial growth process creates both transistor active regions and capacitor dielectric layers, while lithography etching patterns both transistor gates and capacitor electrodes, making the manufacturing process multi-functional and highly efficient.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Ease of operation

If additional metal electrodes and pads are used for component connections, then electrical connectivity is improved, but device dimensions and manufacturing costs increase

Engineering Contradiction:
Improveelectrical connectivityVSAvoiddevice dimensions
Core Design Contradiction:
Ease of operationVSVolume of moving object

Solution Approach 1:

The patent combines the metal electrode structures to serve dual functions. The same metal layer and electrode patterns are used for both transistor interconnection and capacitor connection, eliminating redundant electrodes and pads while ensuring proper electrical connectivity for both components.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The metal electrode structure is designed with multi-functionality, where a single electrode system provides both transistor gate/drain/source connections and capacitor plate connections. This universal electrode design reduces the overall device footprint and eliminates the need for separate connection structures.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If different materials are used for transistor and capacitor fabrication, then component performance is optimized, but manufacturing costs and process complexity increase

Engineering Contradiction:
Improvecomponent performanceVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent uses homogeneous III-V semiconductor material for both transistor and capacitor fabrication. This material uniformity simplifies the manufacturing process by eliminating the need for separate material deposition and processing lines, reducing costs while maintaining optimized performance characteristics for both components through material consistency.

Inventive Principle:
Principle #33Homogeneity

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration simplifies the manufacturing process, reduces costs, and minimizes dimensions by eliminating the need for additional metal electrodes and pads, while maintaining high performance due to the use of III-V semiconductor materials.

Implementation Method 1

both fabricated using an epitaxy process with lithography etching

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Implementation Method 2

both fabricated using an epitaxy process with lithography etching

Methodology Applied
Scientific EffectEtching:

Data Source

PatentUS20250063801A1Electronic device
Publication Date: 2025.02.20 INNOLUX CORP
  • US20250063801A1 patent drawing
  • US20250063801A1 patent drawing
  • US20250063801A1 patent drawing

AI summary

The disclosure provides an electronic device. The electronic device includes a substrate, a transistor, and a variable capacitor. The transistor is disposed on the substrate. The variable capacitor is disposed on the substrate and adjacent to the transistor. A material of the transistor and a material of the variable capacitor both a include a III-V semiconductor material. The electronic device of an embodiment of the disclosure may simplify manufacturing process, reduce costs, or reduce dimensions.