Image Defect Highlight Switching for Faster Diagnosis Review
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Solution Overview
Problem
Existing image diagnosis systems require customer engineers to manually verify image-quality defects one by one, increasing their burden in identifying and understanding the nature of defects in image forming apparatuses.
Innovation Solution
An image diagnosis system that utilizes processors to acquire images, detect defects, and perform highlighting of defect locations based on specific events, varying the highlighting form and type to distinguish between different defects, thereby simplifying defect identification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If image-quality defects are displayed simply according to defect type, then the display method is simple, but the customer engineer's burden in comprehending and verifying defects increases
Solution Approach 1:
The patent segments the verification process by enabling selective highlighting of specific defect types or individual defects based on customer engineer instructions. Instead of requiring verification of all defects simultaneously, the system divides the task into manageable portions by highlighting only relevant defects at any given time, thereby reducing the overall verification burden.
Solution Approach 2:
The patent implements dynamic highlighting where the display state changes based on user interaction. The customer engineer can instruct the system to highlight different defects or defect types as needed, making the verification process flexible and adaptive to specific troubleshooting needs rather than requiring static verification of all defects.
2Loss of information
If all image-quality defects are highlighted simultaneously, then complete defect information is provided, but the customer engineer cannot easily identify specific defect types
Solution Approach 1:
The patent segments the defect information display by allowing selective highlighting of specific defect types or individual defects. This segmentation enables the customer engineer to focus on one defect type or specific defect at a time, making identification easier while the system maintains the capability to display all defects when needed.
Solution Approach 2:
The patent applies local quality by making different defects visible with different highlighting states based on user selection. Instead of uniform display of all defects, the system applies different visual emphasis to different defects or defect types, allowing the customer engineer to easily identify specific defects of interest while maintaining access to complete information.
3Device complexity
If manual verification of each defect is required, then simple display mechanism is used, but time consumption for troubleshooting increases
Solution Approach 1:
The patent implements dynamic control of defect highlighting based on customer engineer instructions. This allows the system to automatically present specific defects or defect types for verification, reducing the time needed for troubleshooting by eliminating the need to manually examine each defect while maintaining a relatively simple display mechanism.
Solution Approach 2:
The patent incorporates feedback mechanisms where the customer engineer provides instructions about which defects to highlight, and the system responds by adjusting the highlighting display accordingly. This feedback loop enables efficient troubleshooting by allowing the engineer to quickly navigate to specific defects of interest without exhaustive manual verification.
Data Source
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AI summary
An image diagnosis system includes one or more processors configured to: acquire an image for image diagnosis formed by an image forming apparatus serving as a diagnosis target; detect, from the image for image diagnosis, an image-quality defect in the image for image diagnosis; and perform switching of highlighting of an occurrence location of the detected image-quality defect, the switching being performed on a basis of an event.