Image Defect Detection with Histogram-Adjusted Neural Sub-Regions

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Solution Overview

Problem

Existing methods for detecting defects in product images, such as misprinted characters, are often inaccurate.

Innovation Solution

A method involving geometric correction using SIFT and RANSAC algorithms, histogram equalization, and neural network training to enhance image sub-regions for accurate defect detection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional defect detection methods are used, then the detection process is simple, but the detection accuracy is poor

Engineering Contradiction:
Improvedefect detection accuracyVSAvoiddetection system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the image into multiple sub-regions after geometric correction and processes each sub-region independently through histogram equalization and neural network analysis. This segmentation allows the system to handle complex images by breaking them into manageable portions, improving detection accuracy without overwhelming the processing system.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs geometric correction using SIFT and RANSAC algorithms before defect detection, and pre-processes images through histogram equalization. These preliminary actions enhance image quality and prepare the data for more accurate neural network analysis, resolving the contradiction by preparing complex data in advance rather than during real-time detection.

Inventive Principle:
Principle #10Preliminary action

2Measurement precision

If image processing steps are added to improve quality, then defect detection accuracy improves, but processing time increases

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidprocessing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

By dividing the image into sub-regions and processing them in parallel, the patent reduces overall processing time. Each sub-region can be independently corrected and analyzed, allowing concurrent operations that complete faster than sequential processing of the entire image.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies histogram equalization to transform pixel intensity distributions, enhancing image contrast and feature visibility. This parameter transformation improves detection accuracy while the algorithmic optimization keeps processing time manageable by working with transformed data rather than original images.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12536647B2Neural network-based image detection method with histogram adjustment, computing device, and storage medium
Publication Date: 2026.01.27 HON HAI PRECISION INDUSTRY CO LTD
  • US12536647B2 patent drawing
  • US12536647B2 patent drawing
  • US12536647B2 patent drawing

AI summary

An image detection obtains first images with defects. Each of the first images is corrected and divided to obtain first sub-region images. The first sub-region images are processed to obtain processed first sub-region images. The processed first sub-region images are used to train a neural network to obtain a target mode. Second images are obtained. Each of the second images is corrected and divided to obtain second sub-region images. The second sub-region images are processed to obtain processed second sub-region images. The target model is applied to detect each of the processed second sub-region images to obtain a detection result. The method can detect defects in images accurately and efficiently.