Image Inspection System Dynamic Defect Level Adjustment
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Solution Overview
Problem
Conventional image inspection systems require manual setting of permissible defect levels, which is non-intuitive and often results in undesired settings, especially when dealing with variable printing where defects need to be evaluated across different types and areas.
Innovation Solution
An image inspection system that includes a processing circuitry-based system for generating inspection reference images, determining defect types and levels, and allowing users to intuitively set and adjust permissible defect levels through a user interface, enabling dynamic classification and display of normal and abnormal images based on user-defined criteria.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If manual setting of permissible defect levels is used, then the system can operate with simple structure, but the ease of operation deteriorates because it is non-intuitive and difficult for users to set appropriately
Solution Approach 1:
The system automatically determines permissible defect levels by analyzing actual printed matter images and user corrections, eliminating the need for manual configuration. The system learns from user interactions with abnormal image corrections to autonomously set appropriate defect thresholds for different defect types
Solution Approach 2:
The system incorporates feedback loops where user corrections of abnormal images are used to refine and adjust permissible defect levels. The system continuously learns from user decisions about what constitutes acceptable versus unacceptable defects, improving the intuitiveness and accuracy of defect level settings
2Ease of operation
If automatic determination of permissible defect levels is implemented, then the ease of operation improves, but the device complexity increases due to additional processing requirements
Solution Approach 1:
The system performs preliminary analysis of printed matter images to pre-determine permissible defect levels before actual inspection begins. By analyzing training images and pre-establishing defect thresholds, the system reduces the computational burden during real-time inspection while maintaining ease of operation
Solution Approach 2:
The system segments the defect analysis into distinct defect types (e.g., stains, missing patterns, extra patterns) and determines permissible levels for each type separately. This segmentation allows the processing circuitry to focus on specific defect characteristics, reducing overall complexity while improving operational ease
3Ease of operation
If defect levels are set for specific areas only, then the ease of operation improves, but the measurement precision deteriorates because it does not account for all defect types across the entire image
Solution Approach 1:
The system applies different permissible defect levels to different defect types and image areas based on local characteristics. Each defect type (stain, missing pattern, extra pattern) has its own permissible level, and these levels can vary by image region, achieving both operational ease and measurement precision through localized quality control
Data Source
AI summary
An image inspection apparatus for inspecting an image output on a recording medium by scanning the recording medium as a scanned image. The inspection apparatus having a display controller that controls display of a normal read image, which includes only permissible defects for each type of defect, in the normal image display area, and that controls display of an abnormal read image, which includes at least one impermissible defect for each type of defect, in the abnormal image area. The inspection apparatus also includes a defect permissible changing unit that receives a moving operation instruction, which moves the displayed image between the normal image display area and the abnormal image display area and that, in response to receiving the moving operation instruction, changes the permissible defect level of at least one type of defect.