Image Inspection with Targeted Re-Imaging of Defect Candidates
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing image inspection systems face challenges in efficiently inspecting multi-type, small-scale production products due to the need for high-resolution images and increased calculation processing, especially when using robot arms for image capture, which can lead to longer inspection times and potential errors in defect detection.
Innovation Solution
An image inspecting apparatus and method that involves capturing images under a first condition, searching for defect candidates, and then re-capturing images under a higher resolution condition to clearly photograph and determine the presence of defects, reducing the need for extensive image analysis across the entire object and shortening inspection time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If image capturing is performed by efficiently moving the image capturing apparatus attached to the robot arm, then there is a possibility that such image capturing can cope with multi-type, small-scale production and shorten the time required for capturing the image, but the number of times of movement of the image capturing apparatus and the calculation processing required for the image analysis are expected to increase
Solution Approach 1:
The system performs a preliminary low-resolution scan of the entire object to identify defect candidates before performing high-resolution imaging only on those specific regions. This preliminary action reduces the overall imaging time while maintaining inspection accuracy by avoiding unnecessary high-resolution capture of defect-free areas.
Solution Approach 2:
The system applies different imaging qualities to different regions of the object based on defect probability. Low-resolution imaging is used for the entire object during the preliminary scan, while high-resolution imaging is applied only to regions where defect candidates are detected, optimizing both speed and accuracy.
2Productivity
If image capturing is performed by efficiently moving the image capturing apparatus attached to the robot arm, then there is a possibility that such image capturing can cope with multi-type, small-scale production and shorten the time required for capturing the image, but the calculation processing required for the image analysis is expected to increase
Solution Approach 1:
The system extracts only the necessary high-resolution image data from defect candidate regions identified in the preliminary low-resolution scan, rather than processing entire high-resolution images of the whole object. This extraction approach significantly reduces calculation processing requirements while maintaining defect detection accuracy.
Solution Approach 2:
The system performs a complete preliminary scan at low resolution to ensure no defects are missed, then performs partial high-resolution imaging only on suspected defect regions. This partial action approach balances thorough inspection with reduced computational burden.
3Measurement precision
If it is attempted to carry out the image analysis on the appearance of the object under inspection to the extent of every corner by using the image capturing apparatus attached to the robot arm, then high-resolution imaging can be achieved, but the number of times of movement of the image capturing apparatus and the calculation processing required for the image analysis are expected to increase
Solution Approach 1:
The system performs a preliminary low-resolution scan to identify defect candidates before performing time-consuming high-resolution imaging only on those specific regions, significantly reducing total inspection time while maintaining measurement precision where needed.
Solution Approach 2:
The system applies high measurement precision (high-resolution imaging) only to local regions where defect candidates are detected, rather than uniformly applying high resolution to the entire object, thereby reducing inspection time while maintaining accuracy for potential defects.
Data Source
AI summary
An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.