Image Inspection Analysis for Luminance-Aware Defect Detection
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Solution Overview
Problem
Existing inspection systems struggle to accurately detect defects on coated surfaces due to challenges in improving the accuracy of defect detection, particularly in the analysis of the relationship between the irradiation region and the inspection target region.
Innovation Solution
An analysis apparatus that extracts images where the irradiation region and the inspection target region have a predetermined relationship, utilizing hardware processors to analyze the state of the inspection target region based on image information, and employs learned models for enhanced defect detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If images are captured under varying light conditions to cover more inspection areas, then the coverage area increases, but the measurement precision deteriorates due to luminance non-uniformity
Solution Approach 1:
The patent segments the inspection process by dividing images into multiple regions based on luminance characteristics. It identifies a first region with uniform luminance and a second region with non-uniform luminance, then processes each region differently to maintain detection accuracy across the entire inspection area.
Solution Approach 2:
The patent applies local quality by using different analysis methods for different regions of the image. The first region (uniform luminance) and second region (non-uniform luminance) receive different processing treatments, optimizing defect detection for each specific luminance condition.
2Measurement precision
If complex illumination control is implemented to maintain uniform luminance, then the measurement precision improves, but the device complexity increases
Solution Approach 1:
The patent implements self-service by using the captured image data itself to identify and correct for luminance non-uniformity. The system automatically detects regions with non-uniform luminance and applies appropriate processing, eliminating the need for complex external illumination control mechanisms.
Solution Approach 2:
The patent changes processing parameters based on luminance characteristics. It dynamically adjusts the defect detection algorithm based on whether a region has uniform or non-uniform luminance, adapting the inspection parameters to match the actual lighting conditions without requiring physical illumination changes.
3Reliability
If all captured images are analyzed to ensure no defects are missed, then the reliability improves, but the loss of time increases due to processing large data volumes
Solution Approach 1:
The patent extracts and processes only the most relevant information from captured images. By identifying and focusing on regions with non-uniform luminance and using region-specific processing, it reduces the overall data processing burden while maintaining comprehensive defect coverage.
Solution Approach 2:
The patent applies partial action by using different processing intensities for different regions. The first region with uniform luminance receives standard processing, while the second region with non-uniform luminance receives enhanced processing, optimizing the balance between reliability and processing time.
Data Source
AI summary
An analysis apparatus includes: a hardware processor that: acquires image information items of a plurality of images regarding a target that are captured while the target is irradiated with light, extracts, based on the image information items, an image in which an irradiation region where the target is irradiated with the light and an inspection target region of the target have a predetermined relationship, from among the images, and analyzes a state of the inspection target region based on each of the image information items of the extracted image.