Image Measuring Device Thickness Correction for Transillumination Errors

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Solution Overview

Problem

Image measuring devices face measurement errors due to variations in thickness and optical characteristics of work pieces, leading to inaccuracies in dimension measurement, particularly when using transillumination, where light is blocked by thicker work pieces, resulting in increased dark portions and larger measured values.

Innovation Solution

An image measuring method and device that corrects measured values by calculating a preset value from a standard reference object's dimensions using a predetermined measurement tool and applying it to measured objects, thereby adjusting for measurement errors caused by thickness, cross-sectional shape, and optical characteristics, ensuring more accurate measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If transillumination is used to measure work piece dimensions, then the measurement process is simplified and speed is improved, but measurement precision deteriorates due to light being blocked by thicker portions of the work piece

Engineering Contradiction:
Improvemeasurement speedVSAvoiddimension measurement accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The invention performs preliminary action by measuring the thickness of the work piece before conducting the dimension measurement. This preliminary thickness measurement allows the system to pre-calculate the light absorption characteristics and compensate for the blocking effect during the subsequent dimension measurement, thereby maintaining both high speed and high precision

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention implements feedback by using the measured thickness information to adjust and correct the dimension measurement results. The system feeds back the thickness data to modify the interpretation of the optical image, compensating for the light blocking effect and improving measurement accuracy without sacrificing measurement speed

Inventive Principle:
Principle #23Feedback

2Volume of moving object

If the work piece thickness increases, then the work piece can accommodate more functional elements, but measurement accuracy deteriorates due to increased light blocking

Engineering Contradiction:
Improvework piece thicknessVSAvoiddimension measurement accuracy
Core Design Contradiction:
Volume of moving objectVSMeasurement precision

Solution Approach 1:

The system performs preliminary thickness measurement to understand the light blocking characteristics before dimension measurement. This allows the system to prepare compensation parameters in advance, enabling accurate measurements regardless of the work piece thickness

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention changes the interpretation parameters of the optical image based on the measured thickness. By adjusting measurement parameters according to thickness, the system compensates for the light blocking effect, allowing accurate dimension measurement of work pieces with varying thicknesses

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method allows for highly accurate dimension measurements by correcting measurement errors across multiple work pieces with similar design values, effectively addressing the trend of measurement inaccuracies in image measuring devices, particularly in products with identical or closely similar design values.

Implementation Method 1

When light strikes from below the work piece W due to the transillumination 35, although light is blocked by a portion of the work piece W

Methodology Applied
Scientific EffectLight transmission: Light

Data Source

PatentUS11257205B2Image measuring method and apparatus
Publication Date: 2022.02.22 MITUTOYO CORP
  • US11257205B2 patent drawing
  • US11257205B2 patent drawing
  • US11257205B2 patent drawing

AI summary

An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.