Image Overlap Correction via Reference Line Segmentation

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Solution Overview

Problem

Existing multi-projection systems face challenges in displaying high-quality images due to image distortion caused by projector lenses, which affects the accuracy of overlapping images and results in image degradation.

Innovation Solution

An information processing apparatus with an obtaining unit, setting unit, and correction unit that sets reference lines within overlap areas and performs specific corrections based on the shapes of these areas to align and overlap images accurately, reducing the area of correction and suppressing image degradation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If image distortion correction is performed for the entire overlap area, then the alignment accuracy is improved, but the image quality degrades due to excessive correction

Engineering Contradiction:
Improvealignment accuracyVSAvoidimage quality
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The overlap area is divided into multiple sub-areas by introducing reference lines. The correction is then applied separately to each sub-area with different correction priorities. This segmentation allows precise alignment in the critical overlap region while preserving image quality in other areas, resolving the contradiction between alignment accuracy and image quality.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different correction strategies are applied to different regions of the overlap area. The first sub-area (between the reference line and first end side portion) receives correction based on the first reference line, while the second sub-area (between the reference line and second end side portion) receives correction based on the second reference line. This local differentiation enables precise alignment where needed while maintaining image quality elsewhere.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If the correction target area is reduced, then image quality degradation is suppressed, but the alignment accuracy may be compromised

Engineering Contradiction:
Improveimage qualityVSAvoidalignment accuracy
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The overlap area is segmented into multiple sub-areas using reference lines. This segmentation allows the correction to be applied strategically - with higher precision in the overlap region where alignment is critical, and with reduced correction strength in other regions. The result is maintained alignment accuracy while minimizing image quality degradation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different correction priorities are assigned to different sub-areas. The first and second sub-areas are corrected based on their respective reference lines and end side portions, allowing the system to maintain alignment accuracy in critical regions while suppressing image quality degradation in other regions through localized correction strategies.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS9894330B2Information processing apparatus and information processing method for correction of images
Publication Date: 2018.02.13 SONY GROUP CORP
  • US9894330B2 patent drawing
  • US9894330B2 patent drawing
  • US9894330B2 patent drawing

AI summary

An information processing apparatus includes an obtaining unit, a setting unit, and a correction unit. The obtaining unit obtains a first image including a first overlap area having a first end side portion and a second image including a second overlap area having a second end side portion. The setting unit sets a first reference line that forms a first division area in the first overlap area and a second reference line that forms a second division area in the second overlap area. The correction unit executes corrections for the first overlap area, the first division area, and the second division area with the first reference line, the first end side portion, and the second end side portion respectively, the corrections being based on shapes of the first and second overlap areas and based on projection of the first image and the second image.