Image Processing Apparatus Gradient-Based Feature Line Selection
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Solution Overview
Problem
Existing image processing techniques face challenges in accurately detecting feature lines representing boundary lines between object surfaces and backgrounds, leading to incorrect deviation calculations when using non-optimal feature lines for shape inspection and defect visualization in augmented reality applications.
Innovation Solution
An image processing apparatus that detects feature lines from an object image, projects line segments, and selects optimal feature lines based on gradient information to calculate deviation amounts, using a combination of feature line detection, projection, and adjustment regions to enhance accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Difficulty of detecting and measuring
If feature lines are detected from object images for shape inspection, then defect detection capability is improved, but measurement precision deteriorates when non-optimal feature lines are selected
Solution Approach 1:
The patent changes the selection criterion from simple feature line detection to gradient-based optimal feature line selection. By using gradient information to evaluate and select the most appropriate feature lines, the system transforms the parameter selection process to achieve both defect detection capability and measurement precision simultaneously.
Solution Approach 2:
The patent implements a feedback mechanism where gradient information is used to evaluate detected feature lines and select optimal ones. The system continuously refines feature line selection by comparing gradient characteristics, ensuring that only the most accurate feature lines are used for deviation calculation, thus resolving the contradiction between detection capability and precision.
2Difficulty of detecting and measuring
If multiple feature lines are extracted to generate a set of feature lines, then defect detection coverage is improved, but device complexity increases
Solution Approach 1:
The patent extracts only the essential gradient information from multiple feature lines to identify optimal ones. By extracting and comparing gradient characteristics rather than processing all feature line data equally, the system reduces processing complexity while maintaining comprehensive defect detection coverage through selective feature line evaluation.
3Measurement precision
If gradient information is used to select optimal feature lines, then measurement precision is improved, but use of energy increases
Solution Approach 1:
The patent applies partial action by using gradient information selectively for feature line evaluation rather than processing all image data. By focusing computational energy only on gradient-based feature line selection rather than comprehensive image analysis, the system achieves high measurement precision with reduced energy consumption.
Data Source
AI summary
An image processing apparatus includes: a memory that stores shape information including a plurality of line segments representing a shape of an object; and a processor. The processor is configured to: detect a plurality of feature lines from an image of the object, generate a target projection line by projecting any of the plurality of line segments over the image of the object, extract a feature line overlapping with a predetermined region based on the target projection line over the image of the object from the plurality of feature lines to generate a set of feature lines, and select a target feature line from the set of feature lines based on gradient information indicating a gradient of pixel values over the image of the object, and calculate a deviation amount between a line segment corresponding to the target projection line and the target feature line.