Image Processing Apparatus Shadow Reflection Defect Detection

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Solution Overview

Problem

Existing image processing techniques for defect detection on inspection target objects face challenges due to complex three-dimensional shapes and significant surface properties, leading to reduced detection accuracy caused by shadow regions and surface reflection.

Innovation Solution

An image processing apparatus and method that acquire multiple captured images of an inspection target object under varying illumination conditions, allowing for both a first inspection based on a normal image and a second inspection based on the captured images themselves, tailored to specific regions affected by shadow and reflection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a single inspection method based on normal images is used, then the inspection process is simple, but detection accuracy is reduced in shadow and reflection regions

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidinspection method complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The inspection process is segmented into two distinct methods: a first inspection method using normal images for general areas, and a second inspection method using captured images for shadow and reflection regions. This segmentation allows each method to be optimized for its specific use case, improving overall detection accuracy while managing complexity through structured division of labor

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different inspection methods are applied to different regions of the inspection target object based on local characteristics. The second inspection method is specifically applied to regions identified as shadow or reflection areas, while the first method handles other regions. This local adaptation ensures optimal detection accuracy for each region's specific challenges

Inventive Principle:
Principle #3Local quality

2Measurement precision

If multiple inspection methods are employed, then detection accuracy in shadow and reflection regions is improved, but processing complexity increases

Engineering Contradiction:
Improvesurface gradient estimation accuracyVSAvoidimage processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Shadow and reflection regions are identified in advance through image analysis before the inspection process begins. This preliminary identification allows the system to pre-determine which regions require the second inspection method, enabling more accurate surface gradient estimation in problematic areas without adding complexity to the overall processing flow

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The identification of shadow and reflection regions acts as an intermediary step that bridges the simple first inspection method and the more sophisticated second inspection method. This intermediary analysis enables the system to selectively apply the appropriate inspection method based on regional characteristics, improving accuracy while managing processing complexity

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20250076205A1Image processing apparatus, image processing method, and non-transitory computer-readable medium
Publication Date: 2025.03.06 CANON KK
  • US20250076205A1 patent drawing
  • US20250076205A1 patent drawing
  • US20250076205A1 patent drawing

AI summary

An image processing apparatus is provided. The apparatus acquires a plurality of captured images acquired by shooting an inspection target object under a plurality of illumination conditions. The apparatus performs a first inspection for inspecting a surface profile of the inspection target object based on a normal image indicating a normal direction of each position of the inspection target object. The normal image is generated from the plurality of captured images. The apparatus performs a second inspection for inspecting a surface profile of the inspection target object based on the plurality of captured images, the second inspection being different from the first inspection.