Image Rendering Data Correction for Substrate Deformation

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Solution Overview

Problem

Existing image rendering systems face challenges in accurately correcting image rendering data due to substrate deformation, which affects the position coordinates and shape of the image rendering region, leading to deviations in alignment marks and reduced accuracy in rendering images on deformed substrates.

Innovation Solution

A method and system for correcting image rendering data by determining the displacement state of position coordinates on the image rendering object, adjusting the base position coordinates, and maintaining the shape of the image rendering region, using a system comprising an image rendering data device, displacement state determination device, base-position-coordinate correction device, and position-coordinate correction device to ensure precise alignment and rendering.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If image rendering data is corrected based on substrate deformation using alignment marks, then the position coordinates are improved, but the shape of the image rendering region becomes distorted

Engineering Contradiction:
Improveposition coordinates accuracyVSAvoidimage rendering region shape
Core Design Contradiction:
Measurement precisionVSShape

Solution Approach 1:

The image rendering region is divided into multiple smaller regions, and alignment marks are placed at boundaries between these regions. This segmentation allows independent measurement and correction of position coordinates in each region while maintaining the overall shape integrity through coordinated correction across all regions.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The correction method changes from correcting only position coordinates to simultaneously correcting both position coordinates and shape parameters. By measuring both position and shape deviations using alignment marks, the system adjusts rendering data to compensate for substrate deformation while preserving the intended geometry of the image rendering region.

Inventive Principle:
Principle #35Parameter changes

2Shape

If the image rendering region is corrected to maintain its shape, then the shape accuracy is improved, but the position coordinates of alignment marks become inaccurate

Engineering Contradiction:
Improveimage rendering region shapeVSAvoidalignment mark position
Core Design Contradiction:
ShapeVSMeasurement precision

Solution Approach 1:

By dividing the image rendering region into multiple segments with alignment marks at boundaries, the system can measure position deviations independently in each segment while using the alignment marks as reference points to maintain overall shape coherence across all segments.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system uses alignment marks as feedback references to continuously monitor both position and shape deviations. The measured deviations are fed back to adjust the rendering data, creating a closed-loop correction process that simultaneously optimizes both position accuracy and shape preservation.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If alignment marks are used to measure substrate deformation, then the deformation state is detected, but additional manufacturing steps and complexity are introduced

Engineering Contradiction:
Improvesubstrate deformation detectionVSAvoidmanufacturing process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The alignment marks serve multiple functions: they act as positioning references for image rendering, deformation measurement markers for detecting substrate changes, and shape reference points for maintaining geometric integrity. This multi-functionality eliminates the need for separate measurement systems, reducing overall process complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The alignment marks are formed as part of the substrate itself during the manufacturing process, rather than being added as separate components. The substrate structure provides its own measurement references, eliminating the need for external measurement devices and simplifying the overall system.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS8271919B2Method for correcting image rendering data, method for rendering image, method for manufacturing wiring board, and image rendering system
Publication Date: 2012.09.18 IBIDEN CO LTD
  • US8271919B2 patent drawing
  • US8271919B2 patent drawing
  • US8271919B2 patent drawing

AI summary

A method for correcting image rendering data includes preparing image rendering data having position coordinates that determine an image rendering region and base position coordinates that show the position of a base point arranged in the image rendering region; obtaining a displacement state of position coordinates on an image rendering object; based on the obtained displacement state of position coordinates on the image rendering object, correcting the base position coordinates; and based on the corrected base position coordinates, correcting the position coordinates of the image rendering region while the shape of the image rendering region is maintained.