Image Sensor ADC Bit-Split Conversion for Higher Resolution

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Solution Overview

Problem

Analog-to-digital converters in image sensors face challenges in increasing resolution without increasing complexity or processing time, particularly due to noise dependencies on signal amplitude, which affects the signal-to-noise ratio and requires efficient noise management.

Innovation Solution

The method involves comparing the analog signal amplitude to a threshold representing half the full-scale signal value, performing conversion over a reduced number of bits for most significant or least significant bits based on the comparison, and adjusting the full-scale value and quantization levels accordingly to achieve higher resolution without excessive complexity or time increase.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the number of conversion bits is increased to improve resolution, then the measurement precision is improved, but the device complexity and processing time increase

Engineering Contradiction:
Improveconversion resolutionVSAvoidconverter complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent divides the conversion process into two independent stages: a first converter producing most significant bits (MSBs) and a second converter producing least significant bits (LSBs). This segmentation allows each converter to operate at lower resolution, reducing individual converter complexity while achieving high overall resolution when results are combined.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a temporal dimension by performing conversions at different times with different full-scale ranges. The first conversion occurs before the second, with the second conversion operating on a reduced full-scale range based on the MSB result. This dimensional approach allows high precision without requiring a single complex high-resolution converter.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If the number of conversion bits is increased to improve resolution, then the measurement precision is improved, but the processing time increases

Engineering Contradiction:
Improveconversion resolutionVSAvoidconversion time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The conversion process is segmented into two sequential stages with the second stage operating on a reduced full-scale range. Because the second converter only needs to resolve a smaller portion of the total signal range (determined by the MSBs), it can complete its conversion faster than a single high-resolution converter would require, reducing total processing time.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent performs a first conversion with a full-scale range that is larger than strictly necessary for the final precision requirement, then performs a second conversion with a reduced full-scale range. This partial action approach allows the system to quickly establish the MSBs and then spend less time resolving the LSBs, optimizing overall conversion time.

Inventive Principle:
Principle #16Partial or excessive action

3Productivity

If a variable ramp slope is used to decrease conversion time, then the processing time is reduced, but quantization errors increase

Engineering Contradiction:
Improveconversion speedVSAvoidquantization accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent segments the conversion into two stages, with the second stage using a reduced full-scale range. This allows the use of faster conversion methods (such as variable ramp slopes) in the second stage without compromising overall precision, because the reduced range means fewer quantization levels are needed and the impact of variable slope errors is minimized.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies different conversion strategies to different parts of the signal range. The first converter handles the full-scale range with high accuracy requirements for the MSBs, while the second converter handles only a portion of the range (determined by the MSBs) with relaxed accuracy requirements for the LSBs. This local quality approach allows optimization of conversion speed in the second stage without significantly impacting overall precision.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS7982652B2Analog-to-digital converter
Publication Date: 2011.07.19 STMICROELECTRONICS FRANCE
  • US7982652B2 patent drawing
  • US7982652B2 patent drawing
  • US7982652B2 patent drawing

AI summary

A method of analog-to-digital conversion over n bits of an analog signal, including the steps of: comparing the amplitude of the analog signal with a threshold representing the amplitude of the full-scale analog signal divided by 2k, where k is an integer smaller than n; performing an analog-to-digital conversion of the analog signal over n−k bits to obtain the n−k most significant bits of a binary word over n bits if the result of the comparison step indicates that the amplitude of the input signal is greater than the threshold, and the n−k least significant bits of this binary word otherwise. An analog-to-digital converter and its application to image sensors.